Abstract:
The burn-in apparatus includes a water supply system and a sprayer and has a structure such that water is converted into mist and sprayed onto the upper surface of a device attached to a socket of a burn-in board. The amount of heat generated by the device that generates high heat is removed by the amount of heat that includes a large latent heat from when the mist falls on the upper surface and is evaporated. Burn-in of the device is conducted while it is being cooled to the target temperature.
Abstract:
A battery state diagnosing device applies load to a battery from a load applying section, measures input and output characteristics of the battery, and diagnoses a state of the battery by plugging a result of measurement into a mathematical expression obtained by a system identification method. In the battery state diagnosing device, a current load is used as the load applying section. With this arrangement, the battery state diagnosing device is capable of suitably determining, for example, life and state-of-charge of the battery.
Abstract:
A thermal shock chamber comprising a test area, a high-temperature air conditioning unit having a gas outlet and a gas inlet adjacent to the test area, an outside air supplying unit having an air outlet and an air inlet adjacent to the test area, a low-temperature air conditioning unit having a gas outlet and a gas inlet adjacent to the test area, a first damper assembly for opening the outlet and the inlet of one of the high-temperature air conditioning unit and the outside air supplying unit and closing the outlet and the inlet of the other unit at the same time, and a second damper assembly for opening the outlet and the inlet of one of the low-temperature air conditioning unit and the outside air supplying unit and closing the outlet and the inlet of the other unit at the same time.
Abstract:
An environmental testing device includes a heat insulation chamber that includes a test chamber and is formed using a heat insulation panel that is electrically conductible. The heat insulation chamber includes a chamber body having an entrance and a door that opens and closes the entrance. A heat insulation panel forming the chamber body includes an outer panel and an inner panel. A radiation-absorbent material is disposed between the outer panel and the inner panel. The heat insulation panel forming the chamber body and a heat insulation panel forming the door are connected to each other in an electrically conductible manner.
Abstract:
A refrigerating device includes a refrigerating circuit and a control portion. The refrigerating circuit includes a main flow path in which a compressor, a condenser, an expansion portion, and an evaporator are connected to each other, and a bypass flow path that connects a discharge side of the condenser and a suction side of the compressor, and a flow rate control portion is provided in the bypass flow path. The control portion is configured to set a target temperature of a coolant introduced into the compressor according to a pressure of the coolant on the suction side of the compressor and is configured to change an opening degree of the flow rate control portion such that a temperature of the coolant introduced into the compressor becomes the target temperature. The target temperature when the pressure is high is higher than that when the pressure is low.
Abstract:
An environmental testing device includes a heat insulation chamber that includes a test chamber and is formed using a heat insulation panel that is electrically conductible. The heat insulation chamber includes a chamber body having an entrance and a door that opens and closes the entrance. A heat insulation panel forming the chamber body includes an outer panel and an inner panel. A radiation-absorbent material is disposed between the outer panel and the inner panel. The heat insulation panel forming the chamber body and a heat insulation panel forming the door are connected to each other in an electrically conductible manner.
Abstract:
An apparatus for environmental tests includes a chamber having formed therein a test space for disposing a sample, and a tray that is provided on the upper surface of the chamber and has an open upper surface. A front wall of the tray is configured by an operation unit where switches are provided. A rear wall of the tray is configured by a control unit housing a control substrate. A left wall and a right wall of the tray are configured by hollow bodies connecting the operation unit and the control unit. The tray is covered with a lid.
Abstract:
Provided are a power cycle test apparatus and a power cycle test method that can efficiently reproduce nearly a level of stress that may occur in failure mode in actual environments, the apparatus which is a test apparatus for performing a power cycle test for a power semiconductor device to be tested by applying a thermal stress to the power semiconductor device through the application of a stress current thereto in predefined ON/OFF cycles executes a thermal cycle test in temperature rise-fall cycles longer than the ON/OFF cycles by using an apparatus configured to change an external environmental temperature and further executes the power cycle test while executing the thermal cycle test in synchronization with execution phases of the thermal cycle test.