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公开(公告)号：US11367461B2
公开(公告)日：2022-06-21
申请号：US16857502
申请日：2020-04-24
申请人： FUJIFILM Corporation
发明人： Norihito Kasada
摘要： The magnetic recording medium includes: a non-magnetic support; and a magnetic layer including ferromagnetic powder, in which a difference Safter−Sbefore between a spacing Safter measured on a surface of the magnetic layer by optical interferometry after methyl-ethyl-ketone cleaning and a spacing Sbefore measured on the surface of the magnetic layer by optical interferometry before methyl-ethyl-ketone cleaning is more than 0 nm and 15.0 nm or less, and the non-magnetic support is an aromatic polyamide support having a moisture absorption of 2.2% or less.
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42.发明申请公开(公告)号：US20220146256A1
公开(公告)日：2022-05-12
申请号：US17522846
申请日：2021-11-09
申请人： The Boeing Company
IPC分类号： G01B11/30 , G01N21/958 , G01N21/954
摘要： Apparatus, systems, and methods for the inspection of holes in transparent materials, the apparatus including a processor, an illumination probe, and a detection probe. The illumination probe includes a laser light source and a reflective surface and is configured to be inserted into a first hole in the transparent material. The detection probe includes a second reflective surface and a photodetector and is configured to be inserted in a second hole in the transparent material. Laser light is directed onto the first reflective surface within the first hole and is reflected through a wall of the first hole, into the transparent material, and reflected by the second reflective surface to the photodetector. The photodetector transmits a measured light intensity value to the processor, which compares the light intensity value to a standard intensity value to determine whether or not a crazing condition exists in the second hole.
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公开(公告)号：US20220120559A1
公开(公告)日：2022-04-21
申请号：US17561902
申请日：2021-12-24
发明人： An Andrew ZENG
摘要： Embodiments of the present application provide a measuring apparatus and method of a wafer geometry. The measuring apparatus of the wafer geometry includes: an air-bearing chuck, configured to generate an air cushion to keep a wafer to be measured floating up on a top surface of the air-bearing chuck; and an interferometer, disposed on one side, away from the air-bearing chuck, of the wafer, and configured to obtain an interference fringe image of a front surface of the wafer to measure a geometry of the wafer based on the interference fringe image. An air cushion is generated by utilizing an air-bearing chuck to keep a wafer to be measured floating up on a top surface of the air-bearing chuck, thereby avoiding damage of the original shape of the wafer or contamination of the wafer by a clamping tool, and further reducing errors during measurement.
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公开(公告)号：US20220113260A1
公开(公告)日：2022-04-14
申请号：US17426838
申请日：2019-02-01
申请人： NEC Corporation
发明人： Asuka ISHII
摘要： An image processing apparatus includes a dividing unit, a measuring unit, a comparing unit, and a determining unit. The dividing unit spatially divides a time-series image of a structure surface captured during passage of a traffic load into a plurality of partial regions, and generates a plurality of partial time-series images. The measuring unit measures temporal changes in deflection amount of the structure surface in the respective partial regions from the plurality of partial time-series images. The comparing unit compares the temporal changes in deflection amount of the structure surface in the respective partial regions. The determining unit determines an orientation of the time-series image with respect to a passage direction of the traffic load based on a result of the comparison.
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公开(公告)号：US11287249B2
公开(公告)日：2022-03-29
申请号：US16957031
申请日：2018-12-20
申请人： SOITEC BELGIUM
发明人： Roland Pusche , Stefan Degroote , Joff Derluyn
IPC分类号： G01B11/255 , G01B11/30 , G01N21/95 , G01N21/956
摘要： A system for in-situ measurement of a curvature of a surface of a wafer comprises: a multiwavelength light source module, adapted to emit incident light comprising a plurality of wavelengths; an optical setup configured to combine the incident light into a single beam and to guide the single beam towards a surface of a wafer such that the single beam hits the surface at a single measuring spot on the surface; and a curvature determining unit, configured to determine a curvature of the surface of the wafer from reflected light corresponding to the single beam being reflected on the surface at the single measuring spot.
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46.发明申请公开(公告)号：US20220091020A1
公开(公告)日：2022-03-24
申请号：US17420278
申请日：2019-11-29
发明人： Gang HOU
摘要： A test sample of a vulcanized rubber material is placed under a preset placement condition in a fixing frame in a test tank having a predetermined ozone concentration, and detection data is acquired by detecting, over time, with a laser sensor disposed facing a surface of the test sample that has been placed in the test tank, a distance from the laser sensor to the surface of the test sample; and determining a change in a surface state of the test sample between a plurality of points in time by analyzing, with a computation device, the detection data that has been acquired. Such evaluation method and evaluation system for evaluating ozone deterioration of a vulcanized rubber material can accurately determine a change over time in ozone deterioration while reducing working man-hours.
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公开(公告)号：US20220026572A1
公开(公告)日：2022-01-27
申请号：US17333322
申请日：2021-05-28
发明人： Haonan Dai , Xun Liu , Hang Su
摘要： The present disclosure relates to the technical field of point cloud curve fitting, and in particular, to a fan blade surface profile curve fitting method, system, device, and storage medium. According to the fan blade surface profile curve fitting method, system, device, and storage medium provided by the present disclosure, each frame of obtained point cloud data is fit multiple times to obtain fitting curves, then an average curve based on the point cloud data is obtained by using the fitting curves, and finally a projection of the average curve onto a projection plane is obtained by using the projection plane constructed in each frame of point cloud data, apparently, the projection of the average curve described here is a fan blade surface profile curve proposed by the present disclosure.
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公开(公告)号：US20220011097A1
公开(公告)日：2022-01-13
申请号：US17294635
申请日：2019-11-18
发明人： Rongguang Liang , Junchao Zhang , Xiaobo Tian , Jianbo Shao
摘要： Methods, apparatus and systems for processing interferograms in metrology applications are described. In one example aspect, a method includes obtaining an input phase image based on the interferograms, segmenting the input phase image by classifying the input phase image into multiple regions based on the phase value and a location of each pixel, assigning an integer value to each of the multiple regions, and constructing an output phase image based on the input phase image and the phase offset of each of the multiple regions.
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公开(公告)号：US20210382013A1
公开(公告)日：2021-12-09
申请号：US17343109
申请日：2021-06-09
摘要： A part defect testing system includes a hammer beam system that provides laser light having a first wavelength. A read-out beam system provides laser light having a second wavelength. A control system is used to direct the generated hammer beam laser light toward a first position on a part to provide an acoustic hammer pulse that induces surface movement of the part. An areal camera is arranged to produce an interferogram derived from reading surface movement of the part using the read-out beam directed to a second position on the part.
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公开(公告)号：US20210356260A1
公开(公告)日：2021-11-18
申请号：US17387532
申请日：2021-07-28
发明人： Erez Lampert , Adi Levin , Tal Verker
IPC分类号： G01B11/25 , G01S17/08 , A61C9/00 , G02B3/00 , G02B21/00 , G02B23/26 , G01B11/24 , G01B11/30 , G02B23/24
摘要： An apparatus for measuring a surface topography of a patient's teeth may include an optical probe, a light source configured to generate incident light, and focusing optics configured to focus one or more wavelengths of the incident light to a fixed focal position external to the optical probe, wherein the fixed focal position is fixed relative to the optical probe. The apparatus may further include a light sensor configured to measure a characteristic of returned light generated by illuminating the patient's teeth with the incident light and a processing unit operable to determine the surface topography of the patient's teeth based on the measured characteristic of the returned light.
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