公开(公告)号：US20150168355A1

公开(公告)日：2015-06-18

申请号：US14107217

申请日：2013-12-16

申请人： Jason HABERMEHL ,  Benoit LePAGE ,  Guillaume PAINCHAUD-APRIL

发明人： Jason HABERMEHL ,  Benoit LePAGE ,  Guillaume PAINCHAUD-APRIL

IPC分类号： G01N29/30

CPC分类号： G01N29/30 ,  G01N29/043 ,  G01N29/262 ,  G01N2291/2675

摘要： A calibration method for calibrating a phased array probe that is used for testing girth welds for defects. The method utilizes a calibration device on which is defined a series of reflectors that correspond to a series of target zones. The phased array probe is placed via a wedge relative to the calibration device and the phased array probe is configured with an initial set of acoustic parameters which define at least a transmitting aperture, a receiving aperture and a beam steering angle. Using a Full Matrix Capture (FMC) acquisition process and a ray-tracing module, the values of the initial set of acoustic parameters are optimized to evolve a final set of acoustic parameters which the phased array probe utilizes for testing actual devices for weld defects.

摘要翻译： 用于校准用于测试缺陷的环形焊缝的相控阵探头的校准方法。 该方法使用校准装置，其上定义了一系列对应于一系列目标区域的反射器。 相控阵探头通过相对于校准装置的楔形放置，并且相控阵探头配置有至少限定发射孔，接收孔和束转向角的初始声学参数集合。 使用全矩阵捕获（FMC）采集过程和光线跟踪模块，对初始声学参数集合的值进行优化，以演化相位阵列探针用于测试实际设备的焊接缺陷的最终声参数集。

公开(公告)号：US20130249540A1

公开(公告)日：2013-09-26

申请号：US13427205

申请日：2012-03-22

申请人： Benoit Lepage

发明人： Benoit Lepage

IPC分类号： G01N27/90

CPC分类号： G01N27/9053

摘要： The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.

摘要翻译： 本发明提供了一种用于补偿由涡流阵列探针的剥离变化引起的灵敏度变化的方法。 本发明使用涡流阵列探针线圈以两种分开的方式产生第一组检测通道和第二组剥离测量通道，而不需要添加专用于剥离测量操作的线圈。 本发明的另一方面提供了一种改进的校准过程，其将检测和剥离测量通道校准组合在包括参考缺陷的简单校准块上，而不需要预定义的剥离条件。

公开(公告)号：US08310229B2

公开(公告)日：2012-11-13

申请号：US12410635

申请日：2009-03-25

申请人： Tommy Bourgelas ,  Benoit Lepage

发明人： Tommy Bourgelas ,  Benoit Lepage

IPC分类号： G01N27/82

CPC分类号： G01N27/902

摘要： An intelligent eddy current array probe comprising a plurality of coil elements and an embedded non-volatile memory element is disclosed. Prior to coupling the intelligent eddy current array probe to an NDI system, a data table describing a desired firing sequence for the array probe within a given inspection operation is created. This data table is then stored within the embedded non-volatile memory element of the intelligent eddy current array probe such that when the array probe is coupled to the NDI system, the elements of the NDI system can load and execute the stored firing sequence without operator intervention. In this way, a plurality of intelligent eddy current array probes, each with its own firing sequence, can be used interchangeably within a single NDI system without the need for mechanical adjustments to the NDI system.

摘要翻译： 公开了一种包括多个线圈元件和嵌入式非易失性存储元件的智能涡流阵列探针。 在将智能涡流阵列探针耦合到NDI系统之前，创建在给定检查操作中描述阵列探针的期望发射序列的数据表。 然后将该数据表存储在智能涡流阵列探针的嵌入式非易失性存储器元件内，使得当阵列探针耦合到NDI系统时，NDI系统的元件可以加载并执行所存储的发射序列而不需要操作者 介入。 以这种方式，可以在单个NDI系统内可互换地使用多个智能涡流阵列探头，每个具有其自己的击发序列，而不需要对NDI系统进行机械调整。

公开(公告)号：US07505859B2

公开(公告)日：2009-03-17

申请号：US11696918

申请日：2007-04-05

申请人： Benoit Lepage ,  Patrick Vachon

发明人： Benoit Lepage ,  Patrick Vachon

IPC分类号： G06F19/00

CPC分类号： G01N27/90

摘要： A collection of data processing algorithms which, used in concert, are suitable for use in place of a high pass filter stage in an eddy current inspection system and provide for a system optimized to inspect test pieces for elongated defects running parallel to the scan axis. The algorithms use mathematical techniques to eliminate baseline impedance offset between test pieces, correct for offset drift during a scan, and allow for system balancing using only a set of test pieces of unknown quality.

摘要翻译： 一起使用的数据处理算法的集合适合用于代替涡流检测系统中的高通滤波器级，并且提供优化的系统来检查测试件的平行于扫描轴的细长缺陷的系统。 算法使用数学技术来消除测试片之间的基线阻抗偏移，校正扫描期间的偏移漂移，并允许仅使用一组未知质量的测试片段进行系统平衡。

公开(公告)号：US20080315871A1

公开(公告)日：2008-12-25

申请号：US12123834

申请日：2008-05-20

申请人： Benoit Lepage ,  Martin Roy ,  Stefano Orsi

发明人： Benoit Lepage ,  Martin Roy ,  Stefano Orsi

IPC分类号： G01N27/90 ,  G01N27/83 ,  G01N29/04

CPC分类号： G01N27/904 ,  G01N27/9013 ,  G01N29/221 ,  G01N2291/106 ,  G01N2291/2638

摘要： A flexible array probe is disclosed suitable for use in the non-destructive testing and inspection of test pieces with varying cross-sectional geometries. Array elements—such as, but not limited to, eddy current sensors, piezoelectric sensor elements, and magnetic flux leakage sensors—are mounted on thin alignment fins and coupled together with pairs of pivot mechanisms along the axis of desired rotation. The pivot mechanisms allow rotation in exactly one dimension and force the flexible array probe to align its elements orthogonally to the surface of the structure under test. Alignment and coupling fixtures are also disclosed.

摘要翻译： 公开了一种柔性阵列探针，其适用于具有不同横截面几何形状的试件的无损检测和检验。 诸如但不限于涡电流传感器，压电传感器元件和磁通量泄漏传感器的阵列元件安装在薄的对准翅片上，并且沿着期望的旋转轴线与成对的枢转机构联接在一起。 枢转机构允许在恰好一个维度上旋转，并且迫使柔性阵列探针将其元件与被测结构的表面正交地对齐。 还公开了对准和联接固定装置。