摘要:
An apparatus for detecting X-rays and converting the detected X-ray intensities into digital signals is disclosed. The apparatus places Analog to Digital Conversion (ADC) chips directly under a scintillator array along the X-ray beam direction and uses a shield that is placed between a photodiode substrate and an Analog to Digital Conversion (ADC) chip to block X-rays from directly reaching the dies of the ADC chips, which are sensitive to X-rays. Also an X-ray CT system utilizing the disclosed apparatus for detecting X-rays is provided.
摘要:
A Data Measurement and Acquisition System (DMAS) for multi-slice X-ray CT systems and multi-slice X-ray CT systems using the DMAS are disclosed; wherein the DMAS comprises a plurality of X-ray scintillators, a plurality of photodiode modules, a plurality of digitizing cards, one or more motherboards, and an arced support structure for mounting and securing the photodiode modules, the digitizing cards, and the motherboard(s); wherein the multi-slice X-ray CT systems comprises one or more X-ray sources, and one or more DMAS.
摘要:
A detector system for multi-slice X-ray Computed Tomography (CT) system is disclosed. The detector system comprises a plurality of X-ray detector modules for detecting X-ray photons; wherein each detector module is divided into individual detector elements organized in a matrix fashion with element rows (z-axis for row direction) and element columns (x-axis for column direction) for detecting X-ray photons; wherein the individual detector elements are interspaced by gaps (areas that do not detect radiation), which are also organized in a matrix fashion with gap rows and gap columns; and an anti-scatter collimator comprising a plurality of anti-scatter plates, which is placed above the detector modules and aligned to focus on an X-ray source of the CT system; wherein some or all of the anti-scatter plates are placed above the detector elements; wherein those anti-scatter plates that are placed above the detector elements block a portion of primary X-ray photons from the X-ray source in addition to scattered X-ray photons from reaching the detector elements.