摘要:
A method for determining the properties of surfaces wherein a first process step specified radiation emits from at least one radiation source to a measuring surface, in further process steps the radiation reflected and/or scattered off the measuring surface is detected by a plurality of image-capturing components, and a signal is generated which specifies at least one parameter of the radiation detected by the image-capturing components. In further process steps the first signals are grouped based on predetermined criteria to form group signals, and at least one group-specific evaluation figure is computed, and a dependent statistical parameter correlating with at least one measuring surface remission characteristic. Finally at least one statistical parameter is read out in dependence on the predetermined criterion for grouping said first signals. The properties of the surface are specified by a relation between at least two statistical parameters.
摘要:
The present invention relates to a device and a method for determining the properties of surfaces having at least one first radiation means for collimated irradiation of a measurement surface to be examined and at least one second radiation means for non-collimated irradiation of said measurement surface wherein the space above said measurement surface has substantially radiation-absorbing properties. The device of the invention further comprises at least one radiation detector means which captures at least a portion of the radiation reflected and/or diffused off the surface to be examined and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation.
摘要:
The invention relates to a process and a device for determining the properties of reflective and especially heterogeneous reflective bodies having at least one illuminating means which emits light onto a measurement surface, at least one detecting means for recording the light reflected from said measurement surface, wherein said detecting means comprises a plurality of light-sensitive sensor means and whereby a measurement value may issue from substantially each of said sensor means which is characteristic of the light received by each respective sensor means. A first predefined threshold is provided in a memory means. A controlling means serves to control the measurement sequence and comprises a processing means. Said controlling means directs the measurement sequence such that a measurement value of a sensor means is allotted to a first surface type when same exceeds said first threshold. Said controlling means is such configured so as to allow for the determining of at least one statistical parameter which characterizes said first surface type.
摘要:
The proposed method of temperature compensation for opto-electronic devices, more specifically opto-electronic semiconductor devices, involves operation of the device under predetermined constant conditions, where a first temperature dependent characteristic value is measured which is then compared with a comparison value determined under identical constant conditions but at a different temperature. A correction function is derived from the relationship between the characteristic value and the comparison value and used to correct the measured value obtained from the semiconductor device so as to compensate for the effect of temperature.
摘要:
In a method and a device for optically characterizing a goniochromatic surface, for example a metallic painting surface, only a fixed measuring angle setting is used according to the invention.
摘要:
An apparatus and method for measuring the gloss of a surface with a light source projecting light in the direction of the surface and a light-sensitive sensor receiving the light reflected from the surface and converting it into an electrical signal value. A memory storing a program for calculating the characteristic gloss value, a computer for calculating a characteristic gloss value from the electrical signal value, and a display for visually displaying the calculated characteristic gloss value are provided. Five or more reference value pairs are stored in the memory, each pair consisting of a reference characteristic gloss value and a corresponding reference electrical signal value measured by the apparatus on the basis of the reference surface. The measured electrical signal value is compared with the reference signal values and at least the next higher and the next lower value for interpolating the measured gloss.