Device and method for determining the properties of surfaces
    61.
    发明申请
    Device and method for determining the properties of surfaces 有权
    用于确定表面性质的装置和方法

    公开(公告)号:US20050018195A1

    公开(公告)日:2005-01-27

    申请号:US10854926

    申请日:2004-05-27

    申请人: Konrad Lex

    发明人: Konrad Lex

    摘要: A method for determining the properties of surfaces wherein a first process step specified radiation emits from at least one radiation source to a measuring surface, in further process steps the radiation reflected and/or scattered off the measuring surface is detected by a plurality of image-capturing components, and a signal is generated which specifies at least one parameter of the radiation detected by the image-capturing components. In further process steps the first signals are grouped based on predetermined criteria to form group signals, and at least one group-specific evaluation figure is computed, and a dependent statistical parameter correlating with at least one measuring surface remission characteristic. Finally at least one statistical parameter is read out in dependence on the predetermined criterion for grouping said first signals. The properties of the surface are specified by a relation between at least two statistical parameters.

    摘要翻译: 一种用于确定表面性质的方法,其中特定辐射的第一工艺步骤从至少一个辐射源发射到测量表面,在进一步的处理步骤中,由测量表面反射和/或散射的辐射被多个图像 - 捕获组件,并且生成指定由图像捕获组件检测到的辐射的至少一个参数的信号。 在进一步的处理步骤中,基于预定标准对第一信号进行分组以形成组信号,并且计算至少一个组专用评估图,以及与至少一个测量表面缓解特性相关的依赖统计参数。 最后,根据用于对所述第一信号进行分组的预定标准,读出至少一个统计参数。 表面的属性由至少两个统计参数之间的关系指定。

    Device and method for determining the properties of surfaces
    62.
    发明申请
    Device and method for determining the properties of surfaces 有权
    用于确定表面性质的装置和方法

    公开(公告)号:US20040239919A1

    公开(公告)日:2004-12-02

    申请号:US10824066

    申请日:2004-04-14

    申请人: BYK Gardner GmbH

    发明人: Peter Schwarz

    IPC分类号: G01N021/00

    摘要: The present invention relates to a device and a method for determining the properties of surfaces having at least one first radiation means for collimated irradiation of a measurement surface to be examined and at least one second radiation means for non-collimated irradiation of said measurement surface wherein the space above said measurement surface has substantially radiation-absorbing properties. The device of the invention further comprises at least one radiation detector means which captures at least a portion of the radiation reflected and/or diffused off the surface to be examined and emits at least one measurement signal which is characteristic of the reflected and/or diffused radiation.

    摘要翻译: 本发明涉及一种用于确定表面性质的装置和方法,所述装置和方法具有至少一个第一辐射装置,用于待检查的测量表面的准直照射;以及用于所述测量表面的非准直照射的至少一个第二辐射装置,其中 所述测量表面上方的空间具有实质上的辐射吸收特性。 本发明的装置还包括至少一个辐射检测器装置,其捕获从被检测表面反射和/或扩散的辐射的至少一部分,并发射至少一个测量信号,其是反射和/或扩散的特征 辐射。

    Device and process for the determination of the properties of reflective bodies
    63.
    发明申请
    Device and process for the determination of the properties of reflective bodies 有权
    用于确定反射体性质的装置和方法

    公开(公告)号:US20020167669A1

    公开(公告)日:2002-11-14

    申请号:US10140385

    申请日:2002-05-06

    申请人: BYK Gardner GmbH

    发明人: Peter Schwarz

    IPC分类号: G01N021/47

    CPC分类号: G01N21/474

    摘要: The invention relates to a process and a device for determining the properties of reflective and especially heterogeneous reflective bodies having at least one illuminating means which emits light onto a measurement surface, at least one detecting means for recording the light reflected from said measurement surface, wherein said detecting means comprises a plurality of light-sensitive sensor means and whereby a measurement value may issue from substantially each of said sensor means which is characteristic of the light received by each respective sensor means. A first predefined threshold is provided in a memory means. A controlling means serves to control the measurement sequence and comprises a processing means. Said controlling means directs the measurement sequence such that a measurement value of a sensor means is allotted to a first surface type when same exceeds said first threshold. Said controlling means is such configured so as to allow for the determining of at least one statistical parameter which characterizes said first surface type.

    摘要翻译: 本发明涉及一种用于确定具有至少一个向测量表面发射光的照明装置的反射特别是异质反射体的性质的方法和装置,用于记录从所述测量表面反射的光的至少一个检测装置,其中 所述检测装置包括多个感光传感器装置,并且由此可以从基本上每个所述传感器装置发出测量值,该传感器装置是由各个传感器装置接收的光的特征。 在存储器装置中提供第一预定阈值。 控制装置用于控制测量序列并包括处理装置。 所述控制装置引导测量序列,使得当传感器装置的测量值超过所述第一阈值时,分配给第一表面类型。 所述控制装置被配置为允许确定表征所述第一表面类型的至少一个统计参数。

    Method of temperature compensation for optoelectronic components, more
specifically optoelectronic semiconductors
    64.
    发明授权
    Method of temperature compensation for optoelectronic components, more specifically optoelectronic semiconductors 失效
    光电子元件的温度补偿方法,特别是光电子半导体

    公开(公告)号:US5917183A

    公开(公告)日:1999-06-29

    申请号:US809373

    申请日:1997-05-27

    申请人: Uwe Sperling

    发明人: Uwe Sperling

    CPC分类号: G01J1/42 H01L33/0095

    摘要: The proposed method of temperature compensation for opto-electronic devices, more specifically opto-electronic semiconductor devices, involves operation of the device under predetermined constant conditions, where a first temperature dependent characteristic value is measured which is then compared with a comparison value determined under identical constant conditions but at a different temperature. A correction function is derived from the relationship between the characteristic value and the comparison value and used to correct the measured value obtained from the semiconductor device so as to compensate for the effect of temperature.

    摘要翻译: PCT No.PCT / EP95 / 03784 Sec。 371日期:1997年5月27日 102(e)日期1997年5月27日PCT提交1995年9月24日PCT公布。 WO96 / 09667 PCT出版物 日期:1996年3月28日光电子器件,特别是光电子半导体器件的温度补偿方法,涉及在预定的恒定条件下操作器件,其中测量第一温度依赖特性值,然后将其与 在相同恒定条件下但在不同温度下测定比较值。 根据特征值与比较值之间的关系导出校正函数,并用于校正从半导体器件获得的测量值,以补偿温度的影响。

    Method and device for optically characterizing a surface
    65.
    发明授权
    Method and device for optically characterizing a surface 失效
    用于光学表征表面的方法和装置

    公开(公告)号:US5815279A

    公开(公告)日:1998-09-29

    申请号:US679551

    申请日:1996-07-12

    申请人: Konrad Lex

    发明人: Konrad Lex

    IPC分类号: G01J3/46 G01N21/27 G01N21/47

    CPC分类号: G01N21/474

    摘要: In a method and a device for optically characterizing a goniochromatic surface, for example a metallic painting surface, only a fixed measuring angle setting is used according to the invention.

    摘要翻译: 在用于光学表征诸如金属喷漆表面的色度表面的方法和装置中,根据本发明仅使用固定的测量角度设置。

    Method and apparatus for gloss measurement with reference value pairs
    66.
    发明授权
    Method and apparatus for gloss measurement with reference value pairs 失效
    用参考值对进行光泽度测量的方法和装置

    公开(公告)号:US5401977A

    公开(公告)日:1995-03-28

    申请号:US674365

    申请日:1991-06-11

    申请人: Peter Schwarz

    发明人: Peter Schwarz

    IPC分类号: G01N21/57 G01N21/86 G01N21/55

    摘要: An apparatus and method for measuring the gloss of a surface with a light source projecting light in the direction of the surface and a light-sensitive sensor receiving the light reflected from the surface and converting it into an electrical signal value. A memory storing a program for calculating the characteristic gloss value, a computer for calculating a characteristic gloss value from the electrical signal value, and a display for visually displaying the calculated characteristic gloss value are provided. Five or more reference value pairs are stored in the memory, each pair consisting of a reference characteristic gloss value and a corresponding reference electrical signal value measured by the apparatus on the basis of the reference surface. The measured electrical signal value is compared with the reference signal values and at least the next higher and the next lower value for interpolating the measured gloss.

    摘要翻译: PCT No.PCT / EP89 / 01218 Sec。 371日期1991年6月11日 102(e)日期1991年6月11日PCT提交1989年10月13日PCT公布。 出版物WO90 / 04166 日期:1990年04月19日。一种用于测量具有在表面方向上投射光的光源的表面的光泽的装置和方法以及接收从表面反射的光并将其转换成电信号的光敏传感器 值。 存储存储用于计算特征光泽值的程序的存储器,用于从电信号值计算特征光泽值的计算机和用于在视觉上显示所计算的特征光泽值的显示器。 五个或更多个参考值对存储在存储器中,每对由参考特征光泽值和由该装置基于参考表面测量的对应参考电信号值组成。 将测量的电信号值与参考信号值进行比较,并至少在下一个较高值和下一个较低值下进行内插测量光泽度。