公开(公告)号：US08638612B2

公开(公告)日：2014-01-28

申请号：US13854549

申请日：2013-04-01

Applicant: Micron Technology, Inc.

Inventor： Pranav Kalavade ,  Krishna K. Parat ,  Paul D. Ruby

IPC: G11C11/34

CPC classification number: G11C16/12 ,  G11C11/5628 ,  G11C16/0483 ,  G11C16/3454 ,  G11C16/3459 ,  G11C2211/5621

Abstract: Apparatus, methods, and systems are disclosed, including those to improve program voltage distribution width using automatic selective slow program convergence (ASSPC). One such method may include determining whether a threshold voltage (Vt) associated with a memory cell has reached a particular pre-program verify voltage. In response to the determination, a voltage applied to a bit-line coupled to the memory cell may be automatically incremented at least twice as the program voltage is increased, until the cell is properly programmed. Additional embodiments are also described.

Abstract translation: 公开了装置，方法和系统，包括使用自动选择性慢程序融合（ASSPC）来提高编程电压分配宽度的装置，方法和系统。 一种这样的方法可以包括确定与存储器单元相关联的阈值电压（Vt）是否已经达到特定的预编程验证电压。 响应于该确定，施加到耦合到存储器单元的位线的电压可以自动递增至少两倍于编程电压增加，直到单元被适当地编程为止。 还描述了另外的实施例。