Semiconductor memory device
    1.
    发明授权

    公开(公告)号:US12125528B2

    公开(公告)日:2024-10-22

    申请号:US17896929

    申请日:2022-08-26

    发明人: Naofumi Abiko

    摘要: A semiconductor memory device includes memory cell transistors and a control circuit. In a write operation, the control circuit executes multiple loops each including a program operation, a verify operation, and a bit scan operation. In the bit scan operation, the control circuit performs, a first process of generating verify result data in parallel for a group of memory cell transistors having different target threshold voltage states, the verify result data for each memory cell transistor in the group indicating whether the memory cell transistor has reached its target threshold voltage state, and a second process of calculating for each of the target threshold voltage states, the number of memory cell transistors that have not reached their target threshold voltage states.

    MEMORY DEVICE PERFORMING PROGRAM OPERATION
    5.
    发明公开

    公开(公告)号:US20240265980A1

    公开(公告)日:2024-08-08

    申请号:US18359904

    申请日:2023-07-27

    申请人: SK hynix Inc.

    摘要: A memory device includes: a memory block including a plurality of memory cells; a peripheral circuit for performing a program operation on selected memory cells among the plurality of memory cells; and a control logic for controlling the program operation of the peripheral circuit. The control logic controls the peripheral circuit to perform a foggy program operation on first memory cells connected to a first word line among the plurality of memory cells, perform a foggy program operation on second memory cells connected to a second word line adjacent to the first word line among the plurality of memory cells, and perform a fine program operation on the first memory cells, based on a target program state of the second memory cells.

    Advanced window program-verify
    6.
    发明授权

    公开(公告)号:US12046267B2

    公开(公告)日:2024-07-23

    申请号:US17895803

    申请日:2022-08-25

    发明人: Kazuki Yamauchi

    摘要: A memory apparatus and operating method are provided. The apparatus includes memory cells connected to word lines and disposed in strings and configured to retain a threshold voltage corresponding to data states. A control means is configured to program and verify the memory cells during a program operation. The memory cells associated with predetermined ones of the data states are not verified until the memory cells associated with specific prior ones of the data states finish programming to define verify windows ranging between each one of the specific prior ones of the data states and each one of the predetermined ones. The control means adjusts the verify windows in response to the memory cells associated with one of the specific prior ones of the data states not finishing programming before the one of the predetermined ones of the at least one of the verify windows is verified.

    PAGE WRITE REQUIREMENTS FOR A DISTRIBUTED STORAGE SYSTEM

    公开(公告)号:US20240170058A1

    公开(公告)日:2024-05-23

    申请号:US18522111

    申请日:2023-11-28

    摘要: A method for page writes for triple or higher level cell flash memory is provided. The method includes receiving data in a storage system, from a client that is agnostic of page write requirements for triple or higher level cell flash memory, wherein the page write requirements specify an amount of data and a sequence of writing data for a set of pages to assure read data coherency for the set of pages. The method includes accumulating the received data, in random-access memory (RAM) in the storage system to satisfy the page write requirements for the triple or higher level cell flash memory in the storage system. The method includes writing at least a portion of the accumulated data in accordance with the page write requirements, from the RAM to the triple level cell, or the higher level cell, flash memory in the storage system as an atomic write.