Mass spectrometer system
    1.
    发明授权
    Mass spectrometer system 有权
    质谱仪系统

    公开(公告)号:US08334504B2

    公开(公告)日:2012-12-18

    申请号:US12950358

    申请日:2010-11-19

    CPC classification number: H01J49/0422 H01J49/16

    Abstract: This invention describes an analytical system where a kinetic impact ionization source is combined with an RF-only ion guide to form a mass spectrometer system for analysis of the elemental and chemical composition of exoatmospheric particles. The kinetic impact ionization source may be used to transform a flux of particle debris into a beam of ions for analysis by a mass analyzer.

    Abstract translation: 本发明描述了一种分析系统,其中动力学冲击电离源与仅RF离子导向器组合以形成用于分析外加大气颗粒的元素和化学组成的质谱仪系统。 动力学电离源可用于将粒子碎片的通量转换为离子束,以便通过质量分析仪进行分析。

    Mass Spectrometer System
    2.
    发明申请
    Mass Spectrometer System 有权
    质谱仪系统

    公开(公告)号:US20110127423A1

    公开(公告)日:2011-06-02

    申请号:US12950358

    申请日:2010-11-19

    CPC classification number: H01J49/0422 H01J49/16

    Abstract: This invention describes an analytical system where a kinetic impact ionisation source is combined with an RF—only ion guide to form a mass spectrometer system for analysis of the elemental and chemical composition of exoatmospheric particles. The kinetic impact ionisation source may be used to transform a flux of particle debris into a beam of ions for analysis by a mass analyzer.

    Abstract translation: 本发明描述了一种分析系统,其中动力学冲击电离源与仅RF离子导向器组合以形成用于分析外加大气颗粒的元素和化学组成的质谱仪系统。 动力学电离源可用于将粒子碎片的通量转换成离子束,以便通过质量分析仪进行分析。

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