公开(公告)号：US06448766B1

公开(公告)日：2002-09-10

申请号：US09531900

申请日：2000-03-20

Applicant: Ruediger Berger ,  Andreas H. Dietzel ,  Jean Fompeyrine ,  Frank Krause ,  Jean-Pierre Locquet ,  Erich Maechler

Inventor： Ruediger Berger ,  Andreas H. Dietzel ,  Jean Fompeyrine ,  Frank Krause ,  Jean-Pierre Locquet ,  Erich Maechler

IPC: G01R3302

CPC classification number: G01Q60/56 ,  G01R33/10 ,  G11B5/3166 ,  G11B5/455 ,  Y10S977/865

Abstract: Magnetic characterization of the magnetic field emanating from an RWH device is presented using a magnetostrictive layer as a probe between the device and the scanned SFM tip. The findings suggest a very promising technique to resolve magnetic fields laterally at least in the 100 nm realm. Other magnetosensitive properties such as the magnetoelastic and the piezomagnetic effect can be used in a similar way to infer magnetic characteristics of microstructures or of magnetic multilayers.

Abstract translation: 使用磁致伸缩层作为器件与扫描的SFM尖端之间的探针来呈现从RWH器件发出的磁场的磁特性。 研究结果表明，一种非常有前途的技术可以至少在100纳米的领域中横向解决磁场。 可以以类似的方式使用诸如磁弹性和压电效应的其它磁敏性质来推断微结构或磁性多层的磁特性。