Magnetic particle imaging system and magnetic particle imaging method

    公开(公告)号:US11733324B2

    公开(公告)日:2023-08-22

    申请号:US17483809

    申请日:2021-09-24

    CPC classification number: G01R33/1276 G01R33/10

    Abstract: A magnetic particle imaging system includes a field free region generator and an excited magnetic field generator. The field free region generator generates a field free line with a direction of linear extension of a field free region as a direction of extension. The excited magnetic field generator generates an excited magnetic field in the field free line generated by the field free region generator. The excited magnetic field generator includes a first excited magnetic field generation unit and a second excited magnetic field generation unit. The first excited magnetic field generation unit and the second excited magnetic field generation unit are spaced from each other in the direction of extension of the field free line.

    Pulsed magnetic particle imaging systems and methods

    公开(公告)号:US11709212B2

    公开(公告)日:2023-07-25

    申请号:US17581684

    申请日:2022-01-21

    CPC classification number: G01R33/1276 G01R33/10

    Abstract: A pulsed magnetic particle imaging system includes a magnetic field generating system that includes at least one magnet, the magnetic field generating system providing a spatially structured magnetic field within an observation region of the magnetic particle imaging system such that the spatially structured magnetic field will have a field-free region (FFR) for an object under observation having a magnetic nanoparticle tracer distribution therein. The pulsed magnetic particle imaging system also includes a pulsed excitation system arranged proximate the observation region, the pulsed excitation system includes an electromagnet and a pulse sequence generator electrically connected to the electromagnet to provide an excitation waveform to the electromagnet, wherein the electromagnet when provided with the excitation waveform generates an excitation magnetic field within the observation region to induce an excitation signal therefrom by at least one of shifting a location or condition of the FFR. The pulsed magnetic particle imaging system further includes a detection system arranged proximate the observation region, the detection system being configured to detect the excitation signal to provide a detection signal. The excitation waveform includes a transient portion and a substantially constant portion.

    MAGNETIC PARTICLE IMAGING
    6.
    发明申请

    公开(公告)号:US20180017639A1

    公开(公告)日:2018-01-18

    申请号:US15648401

    申请日:2017-07-12

    Abstract: A Magnetic Particle Imaging (MPI) system with a magnet configured to generate a magnetic field with a field free line, the magnet integrated with a flux return designed so that a flux path at approximately the center of the field-free line has a first reluctance and a second flux path distal from the center of the field-free line has a second reluctance, and the second reluctance is lower than the first reluctance to facilitate a high fidelity magnetic field and high fidelity field free line.

    METHOD AND APPARATUS FOR INSPECTING WELD QUALITY
    9.
    发明申请
    METHOD AND APPARATUS FOR INSPECTING WELD QUALITY 有权
    检查焊接质量的方法和装置

    公开(公告)号:US20170067854A1

    公开(公告)日:2017-03-09

    申请号:US14847751

    申请日:2015-09-08

    Applicant: Hitachi, Ltd

    Abstract: An apparatus and method for inspecting the quality of a weld under test in a structure having a plurality of spaced apart welds. Two probes are placed on opposite sides of the structure so that a current path is formed through the weld under test. The probes are energized with alternating current at a known frequency. The magnetic flux generated from the current flow through the probes and at least one of the spaced apart welds is then measured and subsequently compared with magnetic flux data previously determined and representing weld quality.

    Abstract translation: 一种用于在具有多个间隔开的焊缝的结构中检查被测焊缝质量的装置和方法。 两个探针放置在结构的相对两侧,使得通过被测焊缝形成电流路径。 探头以已知频率的交流电通电。 然后测量从流过探头的电流产生的磁通量和至少一个间隔开的焊缝,并随后与先前确定的并表示焊接质量的磁通量数据进行比较。

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