Scanning laser measurement system
    1.
    发明授权
    Scanning laser measurement system 失效
    扫描激光测量系统

    公开(公告)号:US5212738A

    公开(公告)日:1993-05-18

    申请号:US684092

    申请日:1991-04-12

    Abstract: A scanning measurement system comprises a device for imaging an object, wherein the imaging device generates a plurality of data values representing distances from the imaging device to respective points on the object, and a device for processing the data values generated by the imaging device, wherein the processing device comprises a device for entering a predetermined 21/2-D mathematical model of the object, and a device for comparing the data values to the model to determine the object's thickness.

    Abstract translation: 扫描测量系统包括用于对物体成像的装置,其中成像装置产生表示从成像装置到物体上的各个点的距离的多个数据值,以及用于处理由成像装置产生的数据值的装置,其中 处理装置包括用于输入对象的预定的21/2-D数学模型的装置,以及用于将数据值与模型进行比较以确定对象的厚度的装置。

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