Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch
    3.
    发明授权
    Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch 有权
    利用基于颜色的热失配检测涂层缺陷的系统和方法

    公开(公告)号:US08204294B2

    公开(公告)日:2012-06-19

    申请号:US12626381

    申请日:2009-11-25

    IPC分类号: G06K9/00

    CPC分类号: G01N25/72

    摘要: A method of analyzing a thermal image of a coated substrate to determine the presence of defects includes determining a defect temperature range based on a color of the coated substrate and the maximum temperature of the coated substrate in the thermal image. Thereafter, the thermal image is processed by determining a signal value of a pixel of interest based on a temperature of the pixel of interest, temperatures of pixels in a kernel of pixels surrounding the pixel of interest, and the color of the coated substrate. The signal value of the pixel of interest is then compared to the lower temperature threshold of the defect temperature range, wherein the pixel of interest is a defect location when the signal value of the pixel of interest is greater than or equal to the lower temperature threshold.

    摘要翻译: 分析涂覆基板的热图像以确定缺陷的存在的方法包括基于涂覆基板的颜色和热图像中涂覆基板的最高温度来确定缺陷温度范围。 此后,通过基于感兴趣像素的温度,感兴趣像素周围的像素的内核中的像素的温度和涂覆的基板的颜色来确定感兴趣像素的信号值来处理热图像。 然后将感兴趣像素的信号值与缺陷温度范围的较低温度阈值进行比较,其中当感兴趣像素的信号值大于或等于较低温度阈值时,感兴趣的像素是缺陷位置 。

    SYSTEMS AND METHODS FOR DETECTING DEFECTS IN COATINGS UTILIZING COLOR-BASED THERMAL MISMATCH
    4.
    发明申请
    SYSTEMS AND METHODS FOR DETECTING DEFECTS IN COATINGS UTILIZING COLOR-BASED THERMAL MISMATCH 有权
    用于检测使用基于颜色的热不匹配的涂层中的缺陷的系统和方法

    公开(公告)号:US20110123093A1

    公开(公告)日:2011-05-26

    申请号:US12626381

    申请日:2009-11-25

    IPC分类号: G06K9/00

    CPC分类号: G01N25/72

    摘要: A method of analyzing a thermal image of a coated substrate to determine the presence of defects includes determining a defect temperature range based on a color of the coated substrate and the maximum temperature of the coated substrate in the thermal image. Thereafter, the thermal image is processed by determining a signal value of a pixel of interest based on a temperature of the pixel of interest, temperatures of pixels in a kernel of pixels surrounding the pixel of interest, and the color of the coated substrate. The signal value of the pixel of interest is then compared to the lower temperature threshold of the defect temperature range, wherein the pixel of interest is a defect location when the signal value of the pixel of interest is greater than or equal to the lower temperature threshold.

    摘要翻译: 分析涂覆基板的热图像以确定缺陷的存在的方法包括基于涂覆基板的颜色和热图像中涂覆基板的最高温度来确定缺陷温度范围。 此后,通过基于感兴趣像素的温度,感兴趣像素周围的像素的内核中的像素的温度和涂覆的基板的颜色来确定感兴趣像素的信号值来处理热图像。 然后将感兴趣像素的信号值与缺陷温度范围的较低温度阈值进行比较,其中当感兴趣像素的信号值大于或等于较低温度阈值时,感兴趣的像素是缺陷位置 。