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公开(公告)号：US6075338A
公开(公告)日：2000-06-13
申请号：US3206
申请日：1998-01-06
CPC分类号： H02P27/08 , Y10S706/90
摘要： Driving of a three-phase motor includes controlling the slip of the motor by way of a fuzzy logic algorithm. The simplicity and precision of the fuzzy control of the slip permits dynamically optimizing the efficiency of a three-phase motor under any operating condition, and thereby minimizing power consumption. The control is carried out by knowing: the effective speed of the motor that represents the feedback value, and that may be provided by a common encoder (typically a dynamo or an optic device) keyed on the motor's spindled; the stator frequency imposed on the motor; the required speed; and, of course, the characteristic curve (frequency-torque) of the motor.
摘要翻译： 三相电动机的驱动包括通过模糊逻辑算法来控制电动机的滑移。 滑动模糊控制的简单性和精度允许在任何操作条件下动态优化三相电动机的效率，从而最小化功耗。 控制是通过知道：表示反馈值的电动机的有效速度，并且可以由键合在电动机上的公共编码器（通常是发电机或光学装置）提供; 定子频率施加在电机上; 所需速度; 当然也是马达的特性曲线（频率转矩）。
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2.发明授权Method and apparatus for testing integrated circuits using a synchronization signal so that all measurements are allotted a time slot of the same length 有权使用同步信号测试集成电路的方法和装置，使得所有测量被分配相同长度的时隙公开(公告)号：US06757632B2
公开(公告)日：2004-06-29
申请号：US10175685
申请日：2002-06-20
IPC分类号： G01R3128
CPC分类号： G01R31/31935 , G01R31/318307 , G01R31/31908
摘要： A method is provided for testing an integrated circuit in an automatic test environment. According to the method, the automatic test environment is set up, and there is performed a repetitive measurement of at least one electrical quantity representative of an integrated circuit response to a set of prescribed integrated circuit test conditions. The automatic test environment is reset, and the integrated circuit test conditions are changed in synchrony with a synchronization signal having a prescribed periodicity, so that all of the measurements are allotted a time slot of the same length. Also provided is an automatic test equipment apparatus that includes a synchronization generator for supplying a synchronization signal having a prescribed periodicity to means for putting the integrated circuit in a set test condition. The means changes the set test condition in synchrony with the synchronization signal, so that all of the measurements are allotted a time slot of the same length.
摘要翻译： 提供了一种在自动测试环境中测试集成电路的方法。 根据该方法，建立自动测试环境，并且对一组规定的集成电路测试条件进行代表集成电路响应的至少一个电量的重复测量。 自动测试环境被复位，并且集成电路测试条件与具有规定周期的同步信号同步地改变，使得所有测量被分配相同长度的时隙。 还提供了一种自动测试设备装置，其包括：同步发生器，用于将具有规定周期的同步信号提供给将集成电路放置在设定的测试状态的装置。 该装置与同步信号同步地改变设置的测试条件，使得所有的测量被分配相同长度的时隙。
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3.发明授权Memory organization method for a fuzzy logic controller and corresponding device 失效用于模糊逻辑控制器和相应设备的存储器组织方法
公开(公告)号：US5621860A
公开(公告)日：1997-04-15
申请号：US257775
申请日：1994-06-09
申请人： Biagio Russo , Claudio Luzzi , Rinaldo Poluzzi
发明人： Biagio Russo , Claudio Luzzi , Rinaldo Poluzzi
CPC分类号： G06N7/04 , G05B13/0275 , G06F1/035 , Y10S706/90
摘要： A method for loading the memory of an electronic controller operating using fuzzy logic, whereby predetermined membership functions of logic variables, defined within a universe of discourse sampled in a finite number of points, are subjected to inference operations basically configured as IF/THEN rules with at least one front preposition and at least one rear implication. The controller includes a central control unit provided with a memory section for storing predetermined values of the membership functions which appear in the front or IF part of the fuzzy rules and have a predetermined degree of truth or membership. This method provides for storing the memory section the only values of those membership functions that have a value of the degree of membership other than zero at the points of the universe of discourse.
摘要翻译： 一种用于加载使用模糊逻辑操作的电子控制器的存储器的方法，由此在有限数量的点中采样的话语范围内定义的逻辑变量的预定隶属度函数经受基本上被配置为IF / THEN规则的推理操作， 至少一个前置介面和至少一个后方暗示。 该控制器包括中央控制单元，该中央控制单元设置有存储部分，用于存储出现在模糊规则的正面或中间部分中并具有预定程度的真值或隶属度的隶属函数的预定值。 这种方法提供了存储器部分的唯一值，它们是在话语世界的点处具有不属于零的隶属度的值的那些隶属函数的值。
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4.发明授权Memory organization method for a fuzzy logic controller and corresponding device 失效用于模糊逻辑控制器和相应设备的存储器组织方法
公开(公告)号：US5574826A
公开(公告)日：1996-11-12
申请号：US257340
申请日：1994-06-09
申请人： Biagio Russo , Claudio Luzzi , Rinaldo Poluzzi
发明人： Biagio Russo , Claudio Luzzi , Rinaldo Poluzzi
CPC分类号： G06F1/035 , G05B13/0275 , G06N7/04 , Y10S706/90
摘要： A method for setting up the memory of an electronic controller operates using fuzzy logic, whereby predetermined membership functions f(m) of logic variables M, defined within a universe of discourse sampled in a finite number of points m, are subjected to inference operations basically configured by IF/THEN rules with at least one front preposition and at least one rear implication. The controller includes a central control unit provided with a memory section for storing predetermined values of the membership functions f(m) which appear in the front or IF part of the fuzzy rules and have a predetermined degree of truth or membership. This method provides for storing into the memory section only the values of those membership functions f(m) which have a value of the degree of membership other than zero at the points m of the universe of discourse.
摘要翻译： 用于设置电子控制器的存储器的方法使用模糊逻辑运行，由此在有限数量的点m中采样的话语范围内定义的逻辑变量M的预定隶属函数f（m）基本上受到推理操作 由IF / THEN规则配置，具有至少一个前置介质和至少一个后置隐含。 该控制器包括一个中央控制单元，该中央控制单元设置有存储部分，用于存储出现在模糊规则的正面或中间部分中并具有预定程度的真值或隶属度的隶属函数f（m）的预定值。 该方法仅在存储器部分中存储那些隶属度函数f（m）的值，它们具有在话语世界的点m处的隶属程度不为零的值。
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5.发明授权Test board de-embedding method to improve RF measurements accuracy on an automatic testing equipment for IC wafers 有权测试板去嵌入方法，以提高IC晶片自动测试设备的RF测量精度公开(公告)号：US06815964B2
公开(公告)日：2004-11-09
申请号：US10033364
申请日：2001-12-26
IPC分类号： G01R3102
CPC分类号： G01R27/28 , G01R31/2822
摘要： The present invention relates to method to improve RF measurements accuracy on an automatic testing equipment (ATE) for IC wafers by implementing a test board de-embedding phase, wherein each wafer includes a device under test located on a wafer die plane and being contacted by probecard needles of a probecard that is coupled to a configuration board through a probe interface board (PIB), the method including the following phases: performing an automatic calibration phase of the testing equipment up to an internal plane located inside the automatic testing equipment; performing a calibration plane transfer up to a plane of the configuration board using a predetermined number of calibration standard loads realized on the wafer; performing a test boards de-embedding phase up to the wafer die plane.
摘要翻译： 本发明涉及通过实施测试板去嵌入阶段来提高IC晶片的自动测试设备（ATE）的RF测量精度的方法，其中每个晶片包括被测器件位于晶片模具平面上并与之接触 通过探针接口板（PIB）耦合到配置板的概念卡的接头针，该方法包括以下阶段：执行测试设备的自动校准阶段直到位于自动测试设备内部的内部平面; 使用在晶片上实现的预定数量的校准标准负载来执行校准平面传输直到配置板的平面; 执行测试板去嵌入阶段直到晶片模具平面。
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