Reducing tester channels for high pinout integrated circuits
    1.
    发明授权
    Reducing tester channels for high pinout integrated circuits 有权
    降低高引脚分布集成电路的测试仪通道

    公开(公告)号:US06971045B1

    公开(公告)日:2005-11-29

    申请号:US10151669

    申请日:2002-05-20

    摘要: An integrated circuit generally comprising a plurality of input pads, an input circuit, and a core circuit. The input pads may be configured to receive a plurality of first input signals. The input circuit may be configured to generate a plurality of second input signals (i) equal to the first input signals while in an operational mode and (ii) responsive to a plurality of test vectors with timing generation determined by the first signals while in a test mode. The core circuit may be responsive to the second input signals.

    摘要翻译: 通常包括多个输入焊盘,输入电路和核心电路的集成电路。 输入焊盘可以被配置为接收多个第一输入信号。 输入电路可以被配置为在操作模式下产生等于第一输入信号的多个第二输入信号(i),以及(ii)响应于具有由第一信号确定的定时产生的多个测试向量,而在 测试模式。 核心电路可以响应于第二输入信号。