公开(公告)号：US20100185675A1

公开(公告)日：2010-07-22

申请号：US12351412

申请日：2009-01-09

申请人： Yunsheng Song ,  Tso-Hui Ting ,  Brian M. Trapp

发明人： Yunsheng Song ,  Tso-Hui Ting ,  Brian M. Trapp

IPC分类号： G06F17/30

CPC分类号： H04L63/0227 ,  G06F21/6218 ,  G06F2221/2141 ,  H04L63/102

摘要： A system and a method are provided. The method includes assigning an entity to a ticket group associated with an ID thereof, displaying to the entity reports, which are each organized with an associated security access control, in accordance with the ticket group, determining whether the entity is authorized to access any selected one or more of the reports in accordance with a result of a comparison between an access level associated with the entity ID and the security access control associated with each of the one or more of the stored reports, and granting or denying the access in accordance with the determination.

摘要翻译： 提供了一种系统和方法。 该方法包括将实体分配给与其ID相关联的票据组，根据票组显示实体报告，每个报告按相关联的安全访问控制进行组织，确定实体是否被授权访问任何所选择的 根据与实体ID相关联的访问级别与与所存储的一个或多个报告中的每一个相关联的安全访问控制之间的比较的结果的一个或多个报告，以及根据 决心。

公开(公告)号：US07751920B2

公开(公告)日：2010-07-06

申请号：US11608419

申请日：2006-12-08

申请人： Thomas P. Moyer ,  Keith Tabakman ,  Brian M. Trapp

发明人： Thomas P. Moyer ,  Keith Tabakman ,  Brian M. Trapp

IPC分类号： G06F19/00

CPC分类号： G01B11/06

摘要： A computing system, method, and computer program product facilitates data mining of information, for example image data, relating to a surface of a manufactured product when the manufactured product is processed using a tool relative to which the manufactured product may be randomly oriented. For each manufactured object, data pertaining to the surface is converted into a weight distribution. A rotational axis along which each surface would tend to rotate under the action of gravity with the surface supported at its geometric centroid is determined. The sets of data can then be properly oriented relative to one another for data mining by aligning the rotational axis of each set of data.

摘要翻译： 计算系统，方法和计算机程序产品有助于数据挖掘信息，例如，当制造产品使用相对于制造产品可以随机取向的工具来处理时，与制成品的表面相关的信息，例如图像数据。 对于每个制造的对象，将与表面相关的数据转换成重量分布。 确定每个表面在重力作用下倾向于以其几何质心支撑表面的旋转轴线。 然后，可以通过对齐每组数据的旋转轴线来相对于彼此来适当地定向数据集用于数据挖掘。

公开(公告)号：US20090112352A1

公开(公告)日：2009-04-30

申请号：US12348549

申请日：2009-01-05

申请人： Thomas S. Barnett ,  Jeanne P. Bickford ,  William Y. Chang ,  Rashmi D. Chatty ,  Sebnem Jaji ,  Kerry A. Kravec ,  Wing L. Lai ,  Gie Lee ,  Brian M. Trapp ,  Alan J. Weger

发明人： Thomas S. Barnett ,  Jeanne P. Bickford ,  William Y. Chang ,  Rashmi D. Chatty ,  Sebnem Jaji ,  Kerry A. Kravec ,  Wing L. Lai ,  Gie Lee ,  Brian M. Trapp ,  Alan J. Weger

IPC分类号： G06F19/00

CPC分类号： G06F17/5081 ,  G06F2217/10

摘要： A storage medium including a method of modeling yield for semiconductor products includes determining expected faults for each of a plurality of library elements by running a critical area analysis on each of the library elements, and assessing, from the critical area analysis, an expected number of faults per unit area, and comparing the same to actual observed faults on previously manufactured semiconductor products. Thereafter, the expected number of faults for each library element is updated in response to observed yield. A database is established, which includes the die size and expected faults for each of the library elements. Integrated circuit product die size is estimated, and library elements to be used to create the integrated circuit die are selected. Fault and size data for each of the selected library elements are obtained, the adjusted estimated faults for each of the library elements are summed, and estimated yield is calculated.

摘要翻译： 包括对半导体产品的产量建模的方法的存储介质包括通过对每个库元素运行关键区域分析来确定多个库元素中的每一个元素的预期故障，并且从临界区域分析来估计预期数量 每单位面积的故障，并将其与先前制造的半导体产品的实际观察到的故障进行比较。 此后，响应于观察到的产量，更新每个库元素的预期数量的故障。 建立了一个数据库，其中包括每个库元素的管芯大小和预期的故障。 集成电路产品芯片尺寸被估计，并且选择用于创建集成电路管芯的库元件。 获得每个所选库元素的故障和大小数据，对每个库元素的调整后的估计故障相加，并计算估计的收益率。

公开(公告)号：US08429193B2

公开(公告)日：2013-04-23

申请号：US12351412

申请日：2009-01-09

申请人： Yunsheng Song ,  Tso-Hui Ting ,  Brian M. Trapp

发明人： Yunsheng Song ,  Tso-Hui Ting ,  Brian M. Trapp

IPC分类号： G06F17/30

CPC分类号： H04L63/0227 ,  G06F21/6218 ,  G06F2221/2141 ,  H04L63/102

摘要： A system and a method are provided. The method includes assigning an entity to a ticket group associated with an ID thereof, displaying to the entity reports, which are each organized with an associated security access control, in accordance with the ticket group, determining whether the entity is authorized to access any selected one or more of the reports in accordance with a result of a comparison between an access level associated with the entity ID and the security access control associated with each of the one or more of the stored reports, and granting or denying the access in accordance with the determination.

摘要翻译： 提供了一种系统和方法。 该方法包括将实体分配给与其ID相关联的票据组，根据票组显示实体报告，每个报告按相关联的安全访问控制进行组织，确定实体是否被授权访问任何所选择的 根据与实体ID相关联的访问级别与与所存储的一个或多个报告中的每一个相关联的安全访问控制之间的比较的结果的一个或多个报告，以及根据 决心。

公开(公告)号：US07477961B2

公开(公告)日：2009-01-13

申请号：US11382963

申请日：2006-05-12

申请人： Thomas S. Barnett ,  Jeanne P. Bickford ,  William Y. Chang ,  Rashmi D. Chatty ,  Sebnem Jaji ,  Kerry A. Kravec ,  Wing L. Lai ,  Gie Lee ,  Brian M. Trapp ,  Alan J. Weger

发明人： Thomas S. Barnett ,  Jeanne P. Bickford ,  William Y. Chang ,  Rashmi D. Chatty ,  Sebnem Jaji ,  Kerry A. Kravec ,  Wing L. Lai ,  Gie Lee ,  Brian M. Trapp ,  Alan J. Weger

IPC分类号： G06F19/00

CPC分类号： G06F17/5081 ,  G06F2217/10

摘要： A method of modeling yield for semiconductor products includes determining expected faults for each of a plurality of library elements by running a critical area analysis on each of the library elements, and assessing, from the critical area analysis, an expected number of faults per unit area, and comparing the same to actual observed faults on previously manufactured semiconductor products. Thereafter, the expected number of faults for each library element is updated in response to observed yield. A database is established, which includes the die size and expected faults for each of the library elements. Integrated circuit product die size is estimated, and library elements to be used to create the integrated circuit die are selected. Fault and size data for each of the selected library elements are obtained, the adjusted estimated faults for each of the library elements are summed, and estimated yield is calculated.

摘要翻译： 一种用于半导体产品的产量建模的方法包括通过对每个库元件运行关键区域分析来确定多个库元件中的每一个元素的预期故障，以及从关键区域分析来估计每单位面积的预期故障数量 并将其与先前制造的半导体产品的实际观察到的故障进行比较。 此后，响应于观察到的产量，更新每个库元素的预期数量的故障。 建立了一个数据库，其中包括每个库元素的管芯大小和预期的故障。 集成电路产品芯片尺寸被估计，并且选择用于创建集成电路管芯的库元件。 获得每个所选库元素的故障和大小数据，对每个库元素的调整后的估计故障相加，并计算估计的收益率。

公开(公告)号：US20080140247A1

公开(公告)日：2008-06-12

申请号：US11608419

申请日：2006-12-08

申请人： Thomas P. Moyer ,  Keith Tabakman ,  Brian M. Trapp

发明人： Thomas P. Moyer ,  Keith Tabakman ,  Brian M. Trapp

IPC分类号： G06F17/00

CPC分类号： G01B11/06

摘要： A computing system, method, and computer program product facilitates data mining of information, for example image data, relating to a surface of a manufactured product when the manufactured product is processed using a tool relative to which the manufactured product may be randomly oriented. For each manufactured object, data pertaining to the surface is converted into a weight distribution. A rotational axis along which each surface would tend to rotate under the action of gravity with the surface supported at its geometric centroid is determined. The sets of data can then be properly oriented relative to one another for data mining by aligning the rotational axis of each set of data.

摘要翻译： 计算系统，方法和计算机程序产品有助于数据挖掘信息，例如，当制造产品使用相对于制造产品可以随机取向的工具来处理时，与制成品的表面相关的信息，例如图像数据。 对于每个制造的对象，将与表面相关的数据转换成重量分布。 确定每个表面在重力作用下倾向于以其几何质心支撑表面的旋转轴线。 然后，可以通过对齐每组数据的旋转轴线来相对于彼此来适当地定向数据集用于数据挖掘。