公开(公告)号：US20050190370A1

公开(公告)日：2005-09-01

申请号：US11064178

申请日：2005-02-23

Applicant: Calin Ciobanu ,  Behzad Rezvani

Inventor： Calin Ciobanu ,  Behzad Rezvani

IPC: A47L15/42 ,  D06F39/00 ,  G01N21/00 ,  G01N21/27 ,  G01N21/49 ,  G01N21/53

CPC classification number: G01N21/274 ,  G01N21/53 ,  G01N2201/0218 ,  G01N2201/127 ,  G01N2201/12707

Abstract: A turbidity measurement system with an improved thermal behavior is provided. A turbidity measurement system includes an analyzer and one or more turbidity sensors. Each turbidity sensor includes a source of illumination and a semiconductor-based illumination sensor. The dark current of the semiconductor-based illumination sensor is measured when no illumination is provided by the source. This measured dark current is then used to provide a dark current-compensated turbidity measurement.

Abstract translation: 提供了具有改进的热性能的浊度测量系统。 浊度测量系统包括分析仪和一个或多个浊度传感器。 每个浊度传感器包括照明源和基于半导体的照明传感器。 当源不提供照明时，测量基于半导体的照明传感器的暗电流。 然后将该测量的暗电流用于提供暗电流补偿浊度测量。

公开(公告)号：US20110098939A1

公开(公告)日：2011-04-28

申请号：US12911994

申请日：2010-10-26

Applicant: Behzad Rezvani ,  Jeffrey Lomibao ,  Calin Ciobanu

Inventor： Behzad Rezvani ,  Jeffrey Lomibao ,  Calin Ciobanu

IPC: G06F19/00 ,  G01N31/00 ,  G11C7/10

CPC classification number: G01N27/4165 ,  G06F1/3203 ,  G06F1/325 ,  G06F1/3275 ,  Y02D10/13 ,  Y02D10/14

Abstract: A process analytic sensor is provided. The process analytic sensor includes a process analytic sensing element that is coupleable to a process. The process analytic sensing element has an electrical characteristic that varies with an analytical aspect of the process. A microcontroller is disposed within the process analytic sensor and is coupled to the process analytic sensing element to sense the electrical characteristic and provide an analytical signal based on the sensed characteristic. The microcontroller is operable on as little as 0.5 milliamps and includes electrically erasable programmable read only memory (EEPROM) that can be written while the microcontroller operates on as little as 0.5 milliamps.

Abstract translation: 提供了一个过程分析传感器。 过程分析传感器包括可与过程耦合的过程分析感测元件。 过程分析感测元件具有随着该过程的分析方面而变化的电特性。 微处理器被布置在过程分析传感器内并且被耦合到过程分析感测元件以感测电特性并且基于感测的特性提供分析信号。 微控制器的工作电压低至0.5毫安，并且包括电可擦除可编程只读存储器（EEPROM），可在微控制器工作在0.5毫安时进行写入。