公开(公告)号：US08982029B2

公开(公告)日：2015-03-17

申请号：US12466690

申请日：2009-05-15

申请人： Biing-Seng Wu ,  Hon-Yuan Leo ,  Cheng-Chi Yen ,  Yih-Long Tseng ,  Yung-Yuan Ho ,  Yen-Chen Chen

发明人： Biing-Seng Wu ,  Hon-Yuan Leo ,  Cheng-Chi Yen ,  Yih-Long Tseng ,  Yung-Yuan Ho ,  Yen-Chen Chen

IPC分类号： G09G3/36

CPC分类号： G09G3/3614 ,  G09G3/3655 ,  G09G2320/0247

摘要： A pixel circuitry of a display device and a display method thereof are provided herein. The pixel circuitry includes a scan switch, a storage element, and a sampling circuitry. The scan switch has a first terminal coupled to a data line and configured to be asserted according to a scan signal. The storage element is coupled to a second terminal of the scan switch and configured to store a pixel voltage from the data line. The sampling circuitry is configured to sample the stored pixel voltage of the storage element and to obtain a reference voltage for the display device according to the sampled signal. By sampling the stored pixel voltage of the storage element, whether the pixel voltages with different polarities are symmetry can be detected for avoiding flickers.

摘要翻译： 本文提供了显示装置的像素电路及其显示方法。 像素电路包括扫描开关，存储元件和采样电路。 扫描开关具有耦合到数据线并被配置为根据扫描信号被断言的第一端子。 存储元件耦合到扫描开关的第二端子并且被配置为存储来自数据线的像素电压。 采样电路被配置为对存储元件的存储的像素电压进行采样，并根据采样信号获得显示设备的参考电压。 通过对存储元件的存储像素电压进行采样，可以检测不同极性的像素电压是否对称，以避免闪烁。

公开(公告)号：US08648787B2

公开(公告)日：2014-02-11

申请号：US12371833

申请日：2009-02-16

申请人： Cheng-Chi Yen ,  Ju-Tien Cheng

发明人： Cheng-Chi Yen ,  Ju-Tien Cheng

IPC分类号： G09G3/36

CPC分类号： G09G3/3648 ,  G09G2320/0233

摘要： A pixel circuitry for a display apparatus is provided herein. The pixel circuitry includes a first storage element, and a switching element composed of a plurality of switches. The first storage element has a first terminal receiving a pixel signal and a second terminal coupled to a first voltage. The first storage element is used for storing the pixel signal. The switching element includes a first switch and a second switch respectively conducted in response to a first signal and a second signal. Each of the first switch and the second switch has an input terminal coupled to a data line and an output terminal coupled to the first storage element. The cooperation of the first switch and the second switch has benefit of delivering the pixel signal without influence of body effect.

摘要翻译： 本文提供了一种用于显示装置的像素电路。 像素电路包括第一存储元件和由多个开关组成的开关元件。 第一存储元件具有接收像素信号的第一端子和耦合到第一电压的第二端子。 第一存储元件用于存储像素信号。 开关元件包括分别响应于第一信号和第二信号而传导的第一开关和第二开关。 第一开关和第二开关中的每一个具有耦合到数据线的输入端和耦合到第一存储元件的输出端。 第一开关和第二开关的协作有利于传递像素信号而不影响身体效应。

公开(公告)号：US20090267877A1

公开(公告)日：2009-10-29

申请号：US12111583

申请日：2008-04-29

申请人： Cheng-Chi Yen ,  Yih-Long Tseng ,  Hon-Yuan Leo ,  Ju-Tien Cheng

发明人： Cheng-Chi Yen ,  Yih-Long Tseng ,  Hon-Yuan Leo ,  Ju-Tien Cheng

IPC分类号： G09G3/36

CPC分类号： G09G3/006 ,  G09G3/3648 ,  G09G3/3674 ,  G09G3/3685 ,  G09G2300/0426 ,  G09G2310/0297

摘要： The LCoS panel includes a display region, an odd and an even data drivers, and a data-line testing unit. The display region includes a plurality of pixel cells formed at each intersection of a plurality of scan lines and a plurality of data lines. The data lines include a plurality of odd data lines coupled to a plurality of first data channels of the odd data driver, and the data lines include a plurality of even data lines coupled to a plurality of second data channels of the even data driver. The odd and the even data drivers are arranged in a first side of the display region. The data-line testing unit is arranged in a second side of the display region opposite to the first side for selectively outputting a data-line testing signal corresponding to one of the data lines according to a data-line selecting signal.

摘要翻译： LCoS面板包括显示区域，奇数和偶数数据驱动器以及数据线测试单元。 显示区域包括形成在多个扫描线和多条数据线的每个交叉处的多个像素单元。 数据线包括耦合到奇数数据驱动器的多个第一数据通道的多个奇数数据线，并且数据线包括耦合到偶数数据驱动器的多个第二数据通道的多个偶数数据线。 奇数和偶数数据驱动器被布置在显示区域的第一侧。 数据线测试单元布置在与第一侧相对的显示区域的第二侧，用于根据数据线选择信号有选择地输出与数据线之一相对应的数据线测试信号。

公开(公告)号：US20090079457A1

公开(公告)日：2009-03-26

申请号：US11860754

申请日：2007-09-25

申请人： Ju-Tien Cheng ,  Yih-Long Tseng ,  Hon-Yuan Leo ,  Cheng-Chi Yen

发明人： Ju-Tien Cheng ,  Yih-Long Tseng ,  Hon-Yuan Leo ,  Cheng-Chi Yen

IPC分类号： G01R31/02

CPC分类号： G01R31/2853 ,  G01R31/31717 ,  G01R31/318505 ,  G01R31/31905

摘要： A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.

摘要翻译： 提供了一种连接测试装置，连接测试方法以及使用它们的芯片。 该方法可用于测试芯片之间的连接，以解决常规多芯片连接测试需要大量测试模式的问题，导致测试时间长，测试成本高，连接条件 测试失败后，故障难以分析。 在本发明中，当芯片中的ESD元件被导通时引起的电压变化，并且使用比较电路来确定连接是否正确。 此外，测试装置内置在芯片中，使得连接测试可以快速有效地完成。 一旦发生连接故障，也可以找到故障连接引脚，从而有利于工程分析，从而有效节省测试成本。

公开(公告)号：US07388624B2

公开(公告)日：2008-06-17

申请号：US11164024

申请日：2005-11-08

申请人： Wei-Hsiao Chen ,  Hon-Yuan Leo ,  Cheng-Chi Yen ,  Yao-Jen Tsai

发明人： Wei-Hsiao Chen ,  Hon-Yuan Leo ,  Cheng-Chi Yen ,  Yao-Jen Tsai

IPC分类号： G02F1/1335 ,  G02F1/1333

CPC分类号： G02F1/136213 ,  G02F1/133553

摘要： A reflective type liquid crystal panel including a substrate, an array of transistors, capacitors, metal patterns, conductive walls, reflective pixel electrodes, an opposite substrate, and a liquid crystal layer is provided. The transistors and the capacitors are disposed on the substrate, and the capacitors are surrounding drain terminals of the corresponding transistors respectively. The metal patterns cover the corresponding transistors and overlap the corresponding capacitors respectively, and the metal patterns are electrically connected to the corresponding drain terminals respectively. The conductive walls surround the corresponding transistors and are connected between the corresponding metal patterns and the corresponding capacitors respectively. The reflective pixel electrodes are disposed over the corresponding metal patterns and electrically connected to the corresponding drain terminals respectively. The opposite substrate has a transparent electrode layer thereon, and the liquid crystal layer is disposed between the transparent electrode layer and the reflective pixel electrodes.

摘要翻译： 提供了包括基板，晶体管阵列，电容器，金属图案，导电壁，反射像素电极，相对基板和液晶层的反射型液晶面板。 晶体管和电容器设置在衬底上，并且电容器分别是相应晶体管的周围的漏极端子。 金属图案分别覆盖对应的晶体管并与相应的电容器重叠，并且金属图案分别电连接到相应的漏极端子。 导电壁围绕对应的晶体管，分别连接在相应的金属图案和相应的电容器之间。 反射像素电极设置在相应的金属图案上并分别电连接到相应的漏极端子。 相对基板上具有透明电极层，液晶层设置在透明电极层和反射像素电极之间。

公开(公告)号：US20080084222A1

公开(公告)日：2008-04-10

申请号：US11539298

申请日：2006-10-06

申请人： Cheng-Chi Yen

发明人： Cheng-Chi Yen

IPC分类号： G01R31/08 ,  G01R27/08

CPC分类号： H05B33/0827 ,  G09G3/3283 ,  H05B33/0815 ,  Y02B20/347

摘要： A current sensing circuit for sensing a current flowing through a LED bank and a driver circuit for driving the LED bank are provided. The current sensing circuit comprises: a matched transistor group, having a first current path coupled to the load device for sensing the load current and a second current path for generating a first current according to the load current; an operation amplifier, coupled to the first and second current paths; and a current source, having a third current path coupled to the second current path and a fourth current path for generating a second current according to the first current, the second current indicating conductive condition of the load device.

摘要翻译： 提供了用于感测流过LED组的电流的电流感测电路和用于驱动LED组的驱动电路。 电流感测电路包括：匹配晶体管组，具有耦合到负载装置的第一电流路径，用于感测负载电流;以及第二电流路径，用于根据负载电流产生第一电流; 耦合到所述第一和第二电流路径的运算放大器; 以及电流源，具有耦合到第二电流路径的第三电流路径和用于根据第一电流产生第二电流的第四电流路径，第二电流指示负载装置的导电状态。

公开(公告)号：US20060176256A1

公开(公告)日：2006-08-10

申请号：US11052914

申请日：2005-02-09

申请人： Cheng-Chi Yen ,  Hon-Yuan Leo ,  Yung-Yuan Ho ,  Yen-Chen Chen

发明人： Cheng-Chi Yen ,  Hon-Yuan Leo ,  Yung-Yuan Ho ,  Yen-Chen Chen

IPC分类号： G09G3/36

CPC分类号： G09G3/3688 ,  G09G2310/027 ,  G09G2310/0297 ,  G09G2320/0209

摘要： The present invention relates to a LCOS display driving system. The driving sequential control block generates a control code representing a loading sequence of the R, G, and B data for pixels in one of scan lines. The multiplexer multiplexes the R, G, and B data from latches according the control code. The shared level shifter shifts the level of the R, G, and B data from the multiplexer. The digital analog converts converting the R, G, and B data to a corresponding analog R, G, and B data voltage. The shared unity-gain buffer stores the analog R, G, and B data voltage from the shared digital analog converter. The demultiplexer demultiplexes the analog R, G, and B data voltage according the control code.

摘要翻译： 本发明涉及一种LCOS显示驱动系统。 驱动顺序控制块生成表示扫描线之一中的像素的R，G和B数据的加载序列的控制代码。 多路复用器根据控制码从锁存器复用R，G和B数据。 共享电平移位器从复用器移位R，G和B数据的电平。 数字模拟转换将R，G和B数据转换为相应的模拟R，G和B数据电压。 共享单位增益缓冲器存储来自共享数字模拟转换器的模拟R，G和B数据电压。 解复用器根据控制码解复用模拟R，G和B数据电压。

公开(公告)号：US20100220085A1

公开(公告)日：2010-09-02

申请号：US12395718

申请日：2009-03-02

申请人： Cheng-Chi Yen

发明人： Cheng-Chi Yen

IPC分类号： G09G5/00

CPC分类号： G09G3/2092 ,  G09G3/20 ,  G09G2310/0235 ,  G09G2310/0275 ,  G09G2310/0286 ,  G09G2310/0289 ,  G09G2310/0294 ,  G09G2310/0297 ,  G09G2310/066

摘要： A display controlling system, which includes: a memory module, for buffering a pixel data; a comparator, for comparing the pixel data and a counter signal to generate a comparing result signal; and a pixel, for refreshing according to the comparing result signal.

摘要翻译： 一种显示控制系统，包括：用于缓冲像素数据的存储器模块; 比较器，用于比较像素数据和计数器信号以产生比较结果信号; 以及用于根据比较结果信号进行刷新的像素。

公开(公告)号：US07768484B2

公开(公告)日：2010-08-03

申请号：US11802143

申请日：2007-05-21

申请人： Jiunn-Yau Huang ,  Cheng-Chi Yen

发明人： Jiunn-Yau Huang ,  Cheng-Chi Yen

IPC分类号： G09G3/36

CPC分类号： G09G3/3283 ,  G09G3/3241 ,  G09G3/3291 ,  G09G2310/027

摘要： An AMOLED panel includes an AMOLED pixel unit, a scan driving unit and a data driving unit. The scan driving unit is coupled to the AMOLED pixel unit. The data driving unit is coupled to the AMOLED pixel unit and a voltage source and includes a switch and a DC-to-AC converter. The switch has a first terminal coupled to the AMOLED pixel unit and a second terminal coupled to the voltage source. The DC-to-AC converter has n+1 bytes, wherein n is a positive integer. The DC-to-AC converter is coupled to a control terminal of the switch and outputs a variable voltage to turn on the switch to make the switch generate a data current. The DC-to-AC converter changes a magnitude of the variable voltage to control a magnitude of the data current.

摘要翻译： AMOLED面板包括AMOLED像素单元，扫描驱动单元和数据驱动单元。 扫描驱动单元耦合到AMOLED像素单元。 数据驱动单元耦合到AMOLED像素单元和电压源，并且包括开关和DC-AC转换器。 开关具有耦合到AMOLED像素单元的第一端子和耦合到电压源的第二端子。 DC-AC转换器具有n + 1个字节，其中n是正整数。 DC-AC转换器耦合到开关的控制端子，并输出可变电压以接通开关以使开关产生数据电流。 DC-AC转换器改变可变电压的大小以控制数据电流的大小。

公开(公告)号：US07683607B2

公开(公告)日：2010-03-23

申请号：US11860754

申请日：2007-09-25

申请人： Ju-Tien Cheng ,  Yih-Long Tseng ,  Hon-Yuan Leo ,  Cheng-Chi Yen

发明人： Ju-Tien Cheng ,  Yih-Long Tseng ,  Hon-Yuan Leo ,  Cheng-Chi Yen

IPC分类号： H01L23/58

CPC分类号： G01R31/2853 ,  G01R31/31717 ,  G01R31/318505 ,  G01R31/31905

摘要： A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.

摘要翻译： 提供了一种连接测试装置，连接测试方法以及使用它们的芯片。 该方法可用于测试芯片之间的连接，以解决常规多芯片连接测试需要大量测试模式的问题，导致测试时间长，测试成本高，连接条件 测试失败后，故障难以分析。 在本发明中，当芯片中的ESD元件被导通时引起的电压变化，并且使用比较电路来确定连接是否正确。 此外，测试装置内置在芯片中，使得连接测试可以快速有效地完成。 一旦发生连接故障，也可以找到故障连接引脚，从而有利于工程分析，从而有效节省测试成本。