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公开(公告)号:US20050274889A1
公开(公告)日:2005-12-15
申请号:US11134090
申请日:2005-05-20
申请人: Daisuke Shindo , Yasukazu Murakami , Tetsuo Oikawa , Masao Inoue
发明人: Daisuke Shindo , Yasukazu Murakami , Tetsuo Oikawa , Masao Inoue
CPC分类号: H01J37/268 , H01J2237/1514 , H01J2237/2588
摘要: There is disclosed an electron microscope equipped with a magnetic microprobe. The microscope can apply a strong electric field to a local area on a specimen made of a magnetic material. The magnetic flux density per unit area of the microprobe is high. The microscope includes a biprism for producing interference between an electron beam transmitted through the specimen and an electron beam passing through a vacuum. The specimen is held to a holder. The microprobe is made of a magnetic material and has a needle-like tip. The microscope further includes a moving mechanism capable of moving the microprobe toward and away from the specimen.
摘要翻译: 公开了一种配备有磁性微探针的电子显微镜。 显微镜可以将强电场施加到由磁性材料制成的试样上的局部区域。 微探针单位面积的磁通密度高。 显微镜包括用于产生透射通过样品的电子束与通过真空的电子束之间的干涉的双棱镜。 标本被固定在一个支架上。 微探针由磁性材料制成并具有针状尖端。 显微镜还包括能够将微探针朝向和远离样品移动的移动机构。
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公开(公告)号:US07241995B2
公开(公告)日:2007-07-10
申请号:US11134090
申请日:2005-05-20
申请人: Daisuke Shindo , Yasukazu Murakami , Tetsuo Oikawa , Masao Inoue
发明人: Daisuke Shindo , Yasukazu Murakami , Tetsuo Oikawa , Masao Inoue
IPC分类号: G21K7/00
CPC分类号: H01J37/268 , H01J2237/1514 , H01J2237/2588
摘要: There is disclosed an electron microscope equipped with a magnetic microprobe. The microscope can apply a strong electric field to a local area on a specimen made of a magnetic material. The magnetic flux density per unit area of the microprobe is high. The microscope includes a biprism for producing interference between an electron beam transmitted through the specimen and an electron beam passing through a vacuum. The specimen is held to a holder. The microprobe is made of a magnetic material and has a needle-like tip. The microscope further includes a moving mechanism capable of moving the microprobe toward and away from the specimen.
摘要翻译: 公开了一种配备有磁性微探针的电子显微镜。 显微镜可以将强电场施加到由磁性材料制成的试样上的局部区域。 微探针单位面积的磁通密度高。 显微镜包括用于产生透射通过样品的电子束与通过真空的电子束之间的干涉的双棱镜。 标本被固定在一个支架上。 微探针由磁性材料制成并具有针状尖端。 显微镜还包括能够将微探针朝向和远离样品移动的移动机构。
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