System and method to correct for distortion caused by bulk heating in a substrate
    1.
    发明授权
    System and method to correct for distortion caused by bulk heating in a substrate 失效
    校正基板中体积加热引起的变形的系统和方法

    公开(公告)号:US06424879B1

    公开(公告)日:2002-07-23

    申请号:US09291167

    申请日:1999-04-13

    IPC分类号: G06F1900

    摘要: An electron beam writing system includes an electron beam patterning machine operable to emit an electron beam to form a pattern on a substrate. A computer control system, coupled to the electron beam patterning machine, has a plurality of pre-computed distortion maps. Each distortion map describes expected distortions of the substrate caused by bulk heating resulting from exposure to the electron beam. The computer control system controls the electron beam patterning machine using the distortion maps in order to adjust for the expected distortions.

    摘要翻译: 电子束写入系统包括可操作以发射电子束以在衬底上形成图案的电子束图案形成机。 耦合到电子束图案机的计算机控制系统具有多个预先计算的失真图。 每个失真图描述了由于暴露于电子束而产生的体积加热引起的基板的预期失真。 计算机控制系统使用失真图来控制电子束图形机,以便对预期的失真进行调整。