APPLICATION AND PHARMACEUTICAL COMPOSITION OF PREACTIVATED AND DISAGGREGATED SHAPE-CHANGED PLATELETS
    1.
    发明申请
    APPLICATION AND PHARMACEUTICAL COMPOSITION OF PREACTIVATED AND DISAGGREGATED SHAPE-CHANGED PLATELETS 审中-公开
    预处理和分散形状变化的板的应用和药物组成

    公开(公告)号:US20160263157A1

    公开(公告)日:2016-09-15

    申请号:US15158345

    申请日:2016-05-18

    IPC分类号: A61K35/19 C12N5/078 A61K9/00

    摘要: Preactivated and disaggregated shape-changed platelets, fixed shape-changed platelets, and a pharmaceutical composition thereof are used for treating acute and emergent inflammatory disease in a dosage of 1×106 to 1×108. SC-PLT is a disaggregated and activated platelet, the secretome from platelet activation has been deprived after SC-PLT preparation but their membrane still preserve cell adhesion molecular and integrin glycoprotein (eg. P-selectin, GP1a, and GPIIb etc.). Therefore, SC-PLTs can trap stromal vascularity inflammatory cells from inflammated and damaged place, and the stromal vascularity inflammatory cells are eliminated through the circulatory system to alleviate inflammation. The fixed shape-changed platelets are able to alleviate inflammation and sustainable for longer storage duration.

    摘要翻译: 预活化和分解形状变化的血小板,固定形状变化的血小板及其药物组合物用于治疗急性和急性炎性疾病,剂量为1×106至1×108。 SC-PLT是一种分解和活化的血小板,血小板活化的分泌物在SC-PLT制备后已被剥夺,但它们的膜仍然保留细胞粘附分子和整联蛋白糖蛋白(例如P-选择蛋白,GP1a和GPIIb等)。 因此,SC-PLT可以从炎症和损伤的地方捕获基质血管炎性细胞,通过循环系统消除基质血管炎性细胞,减轻炎症。 固定的形状变化的血小板能够减轻炎症并且可持续以延长储存期。

    Ampoule opener
    2.
    发明授权
    Ampoule opener 有权
    安瓿开瓶器

    公开(公告)号:US08973800B2

    公开(公告)日:2015-03-10

    申请号:US13799833

    申请日:2013-03-13

    IPC分类号: B67B7/92 B67B7/44

    摘要: An ampoule opener has an opening unit and a cover unit. The opening unit is a rigid frame and has two panels, two head-clamping holes and two pairs of wave-shaped flanges. The panels are respectively an upper panel and a lower panel. The head-clamping holes are elongated in length and tapered in width and are respectively formed through the panels. The pairs of wave-shaped flanges are formed between the panels and the head-clamping holes. The cover unit is flexible, is detachably mounted around the opening unit and has two covering boards, a mounting recess, two body-clamping holes and two pairs of wave-shaped edges. The body-clamping holes are elongated in length and tapered in width and are respectively formed through the mounting boards and communicate with the mounting recess. The pairs of wave-shaped edges are formed between the mounting boards and the body-clamping holes.

    摘要翻译: 安瓿开启器具有开启单元和盖单元。 开口单元是刚性框架,具有两个面板,两个头夹紧孔和两对波形法兰。 面板分别是上面板和下面板。 头夹紧孔的长度是细长的,并且在宽度上呈锥形,分别通过面板形成。 一对波形凸缘形成在面板和头夹紧孔之间。 盖单元是柔性的,可拆卸地安装在开口单元周围,并具有两个覆盖板,安装凹槽,两个主体夹紧孔和两对波形边缘。 主体夹紧孔的长度是细长的,并且在宽度上呈锥形,分别形成在安装板上并与安装凹槽连通。 成对的波形边缘形成在安装板和主体夹紧孔之间。

    OPERATING VOLTAGE TUNING METHOD FOR STATIC RANDOM ACCESS MEMORY
    5.
    发明申请
    OPERATING VOLTAGE TUNING METHOD FOR STATIC RANDOM ACCESS MEMORY 有权
    用于静态随机访问存储器的操作电压调节方法

    公开(公告)号:US20100135093A1

    公开(公告)日:2010-06-03

    申请号:US12325747

    申请日:2008-12-01

    IPC分类号: G11C29/00 G11C5/14

    摘要: An operating voltage tuning method for a static random access memory is disclosed. The static random access memory receives a periphery voltage and a memory cell voltage. The steps of the method mentioned above are shown as follows. First, perform a shmoo test on the static random access memory to obtain a shmoo test plot and a minimum operating voltage. Compare the minimum operating voltage with a preset specification. Position a specification position point on the line which the periphery voltage is equal to the memory cell voltage in the shmoo test plot corresponding to the preset specification. Fix one of the memory cell voltage and the periphery voltage and gradually decrease the other to test the static random access memory and obtain a failure bits distribution. Finally, tune process parameters of the static random access memory according to the specification position point and the failure bits distribution.

    摘要翻译: 公开了一种用于静态随机存取存储器的工作电压调节方法。 静态随机存取存储器接收外围电压和存储单元电压。 上述方法的步骤如下所示。 首先,对静态随机存取存储器执行shmoo测试,以获得shmoo测试图和最小工作电压。 将最小工作电压与预设规格进行比较。 将规格位置点定位在外围电压等于对应于预设规格的shmoo测试图中的存储单元电压的线上。 修复存储单元电压和外围电压之一,并逐渐减小另一个以测试静态随机存取存储器并获得故障位分布。 最后,根据规格位置点和故障位分布调整静态随机存取存储器的进程参数。

    Operating voltage tuning method for static random access memory
    6.
    发明授权
    Operating voltage tuning method for static random access memory 有权
    静态随机存取存储器的工作电压调节方法

    公开(公告)号:US07715260B1

    公开(公告)日:2010-05-11

    申请号:US12325747

    申请日:2008-12-01

    IPC分类号: G11C7/00

    摘要: An operating voltage tuning method for a static random access memory is disclosed. The static random access memory receives a periphery voltage and a memory cell voltage. The steps of the method mentioned above are shown as follows. First, perform a shmoo test on the static random access memory to obtain a shmoo test plot and a minimum operating voltage. Compare the minimum operating voltage with a preset specification. Position a specification position point on the line which the periphery voltage is equal to the memory cell voltage in the shmoo test plot corresponding to the preset specification. Fix one of the memory cell voltage and the periphery voltage and gradually decrease the other to test the static random access memory and obtain a failure bits distribution. Finally, tune process parameters of the static random access memory according to the specification position point and the failure bits distribution.

    摘要翻译: 公开了一种用于静态随机存取存储器的工作电压调节方法。 静态随机存取存储器接收外围电压和存储单元电压。 上述方法的步骤如下所示。 首先,对静态随机存取存储器执行shmoo测试,以获得shmoo测试图和最小工作电压。 将最小工作电压与预设规格进行比较。 将规格位置点定位在外围电压等于对应于预设规格的shmoo测试图中的存储单元电压的线上。 修复存储单元电压和外围电压之一,并逐渐减小另一个以测试静态随机存取存储器并获得故障位分布。 最后,根据规格位置点和故障位分布调整静态随机存取存储器的进程参数。