公开(公告)号：US20060197156A1

公开(公告)日：2006-09-07

申请号：US11414308

申请日：2006-05-01

Applicant: Gehan Joseph Amaratunga ,  Florin Udrea

Inventor： Gehan Joseph Amaratunga ,  Florin Udrea

IPC: H01L27/12

CPC classification number: H01L29/7824 ,  H01L21/84 ,  H01L27/1203 ,  H01L29/41725 ,  H01L29/4175 ,  H01L29/42368 ,  H01L29/78603 ,  H01L29/78624

Abstract: This invention is generally concerned with power semiconductors such as power MOS transistors, insulated gate by bipolar transistors (IGBTs), high voltage diodes and the like, and methods for their fabrication. A power semiconductor, the semiconductor comprising: a power device, said power device having first and second electrical contact regions and a drift region extending therebetween; and a semiconductor substrate mounting said device; and wherein said power semiconductor includes an electrically insulate, layer between said semiconductor substrate and said power device, said electrically insulating layer having a thickness of at least 5 μm.

Abstract translation: 本发明一般涉及诸如功率MOS晶体管，双极晶体管（IGBT）的绝缘栅极，高压二极管等功率半导体及其制造方法。 功率半导体，所述半导体包括：功率器件，所述功率器件具有第一和第二电接触区域和在其间延伸的漂移区域; 以及安装所述装置的半导体衬底; 并且其中所述功率半导体在所述半导体衬底和所述功率器件之间包括电绝缘层，所述电绝缘层具有至少5μm的厚度。