Method and apparatus of pretreatment of an electron gun chamber
    1.
    发明授权
    Method and apparatus of pretreatment of an electron gun chamber 有权
    电子枪室预处理方法及装置

    公开(公告)号:US08878148B2

    公开(公告)日:2014-11-04

    申请号:US12888978

    申请日:2010-09-23

    IPC分类号: G21K5/00 H01J37/06

    摘要: A method of pre-treating an ultra high vacuum charged particle gun chamber by ion stimulated desorption is provided. The method includes generating a plasma for providing a plasma ion source, and applying a negative potential to at least one surface in the gun chamber, wherein the negative potential is adapted for extracting an ion flux from the plasma ion source to the at least one surface for desorbing contamination particles from the at least one surface by the ion flux impinging on the at least one surface.

    摘要翻译: 提供了一种通过离子刺激解吸预处理超高真空带电粒子枪室的方法。 该方法包括产生用于提供等离子体离子源的等离子体,以及向枪室中的至少一个表面施加负电位,其中负电位适于将离子通量从等离子体离子源提取到至少一个表面 用于通过撞击在至少一个表面上的离子通量从至少一个表面解吸污染颗粒。

    METHOD AND APPARATUS OF PRETREATMENT OF AN ELECTRON GUN CHAMBER
    2.
    发明申请
    METHOD AND APPARATUS OF PRETREATMENT OF AN ELECTRON GUN CHAMBER 有权
    电子枪室预处理方法与装置

    公开(公告)号:US20110084219A1

    公开(公告)日:2011-04-14

    申请号:US12888978

    申请日:2010-09-23

    IPC分类号: G21K5/00

    摘要: A method of pre-treating an ultra high vacuum charged particle gun chamber by ion stimulated desorption is provided. The method includes generating a plasma for providing a plasma ion source, and applying a negative potential to at least one surface in the gun chamber, wherein the negative potential is adapted for extracting an ion flux from the plasma ion source to the at least one surface for desorbing contamination particles from the at least one surface by the ion flux impinging on the at least one surface.

    摘要翻译: 提供了一种通过离子刺激解吸预处理超高真空带电粒子枪室的方法。 该方法包括产生用于提供等离子体离子源的等离子体,以及向枪室中的至少一个表面施加负电位,其中负电位适于将离子通量从等离子体离子源提取到至少一个表面 用于通过撞击在至少一个表面上的离子通量从至少一个表面解吸污染颗粒。