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公开(公告)号：US07220500B1
公开(公告)日：2007-05-22
申请号：US09540646
申请日：2000-03-31
申请人： Hiroshi Tomiyasu , Teiichiro Umezawa , Genshichi Hata , Takashi Morikawa , Masato Kobayashi , Masashi Suzuki , Satoshi Yokota , Tsuyoshi Watanabe
发明人： Hiroshi Tomiyasu , Teiichiro Umezawa , Genshichi Hata , Takashi Morikawa , Masato Kobayashi , Masashi Suzuki , Satoshi Yokota , Tsuyoshi Watanabe
CPC分类号： G11B5/732 , G11B5/40 , G11B5/455 , G11B5/66 , G11B5/7325
摘要： There is disclosed a magnetic recording medium in which a seed layer, under layer, intermediate layer, first magnetic layer, nonmagnetic layer, second magnetic layer, protective layer, and lubricant layer are successively laminated on a glass substrate, the nonmagnetic layer is constituted of an alloy containing Cr and C, and the magnetic layer is constituted of an alloy containing Co and Pt. The under layer includes at least the seed layer for finely dividing the crystal particles of the magnetic layer, the seed layer includes at least two or more layers of nonmagnetic films, and the intermediate layer formed of the material different from that of the nonmagnetic film is interposed between the nonmagnetic films. In measurement of the thermal stability of the magnetic recording medium, a head is used, the head includes a read/write element, and a write track width is twice or more as large as a read track width in the head.
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2.发明授权Substrate for an information recording medium, information recording medium using the substrate, and method of producing the substrate 有权用于信息记录介质的基板，使用该基板的信息记录介质以及该基板的制造方法公开(公告)号：US06852010B2
公开(公告)日：2005-02-08
申请号：US10345228
申请日：2003-01-16
CPC分类号： G11B5/7315 , G11B23/0021 , Y10S428/90 , Y10T428/21 , Y10T428/24355
摘要： A substrate for an information recording medium has a microwaviness average height Ra′ not greater than 0.05 microinch as measured by a contactless laser interference technique for measurement points within a measurement region of 50 μm□-4 mm□ on a surface of the substrate. The microwaviness average height Ra′ is given by: Ra ′ = 1 n ∑ i = 1 n | xi - x _ | , where xi represents a measurement point value of each measurement point, {overscore (x)} representing an average value of the measurement point values, n representing the number of said measurement points. Alternatively, the substrate has a waviness period between 300 μm and 5 mm and a waviness average height Wa of 1.0 nm or less as measured by the contactless laser interference technique for measurement points in a measurement region surrounded by two concentric circles which is spaced from a center of a surface of the substrate by a predetermined distance. The waviness average height Wa is given by: Wa = 1 N ∑ i = 1 N | Xi - X _ | where Xi represents a measurement point value of each measurement point, {overscore (X)} representing an average value of the measurement point values, n representing the number of said measurement points.
摘要翻译： 用于信息记录介质的基板具有通过非接触式激光干涉技术测量的微波平均高度Ra'不大于0.05微英寸，用于在基板表面上的测量区域内的测量点为50um□-4mm□。 微波平均高度Ra'由下式给出：其中xi表示每个测量点的测量点值，{overscore（x表示测量点值的平均值，n表示所述测量点的数量，或者，衬底具有 通过非接触式激光干涉技术测量的测量点在300mum至5mm之间的波纹度以及1.0nm或更小的波纹度平均高度Wa，测量点由与两个表面的中心间隔开的两个同心圆包围的测量区域 波纹平均高度Wa由下式给出：其中Xi表示每个测量点的测量点值，（超标（X表示测量点值的平均值，n表示所述测量点的数量） 。
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3.发明授权Magnetic recording medium, and thermal stability measuring method and apparatus of magnetic recording medium 有权磁记录介质，以及磁记录介质的热稳定性测量方法和装置公开(公告)号：US07420886B2
公开(公告)日：2008-09-02
申请号：US11788426
申请日：2007-04-20
申请人： Hiroshi Tomiyasu , Teiichiro Umezawa , Genshichi Hata , Takashi Morikawa , Masato Kobayashi , Masashi Suzuki , Satoshi Yokota , Tsuyoshi Watanabe
发明人： Hiroshi Tomiyasu , Teiichiro Umezawa , Genshichi Hata , Takashi Morikawa , Masato Kobayashi , Masashi Suzuki , Satoshi Yokota , Tsuyoshi Watanabe
CPC分类号： G11B5/732 , G11B5/40 , G11B5/455 , G11B5/66 , G11B5/7325
摘要： There is disclosed a magnetic recording medium in which a seed layer, under layer, intermediate layer, first magnetic layer, nonmagnetic layer, second magnetic layer, protective layer, and lubricant layer are successively laminated on a glass substrate, the nonmagnetic layer is constituted of an alloy containing Cr and C, and the magnetic layer is constituted of an alloy containing Co and Pt. The under layer includes at least the seed layer for finely dividing the crystal particles of the magnetic layer, the seed layer includes at least two or more layers of nonmagnetic films, and the intermediate layer formed of the material different from that of the nonmagnetic film is interposed between the nonmagnetic films. In measurement of the thermal stability of the magnetic recording medium, a head is used, the head includes a read/write element, and a write track width is twice or more as large as a read track width in the head.
摘要翻译： 公开了一种磁性记录介质，其中在玻璃基板上依次层叠种子层，下层，中间层，第一磁性层，非磁性层，第二磁性层，保护层和润滑剂层，非磁性层由 含有Cr和C的合金，磁性层由含有Co和Pt的合金构成。 底层至少包括用于细分磁性层的晶粒的种子层，种子层包括至少两层或更多层非磁性膜，由不同于非磁性膜的材料形成的中间层是 介于非磁性膜之间。 在测量磁记录介质的热稳定性时，使用磁头，磁头包括读/写元件，写磁道宽度是磁头中读磁道宽度的两倍或更多。
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4.发明申请Magnetic recording medium, and thermal stability measuring method and apparatus of magnetic recording medium 有权磁记录介质，以及磁记录介质的热稳定性测量方法和装置公开(公告)号：US20070248844A1
公开(公告)日：2007-10-25
申请号：US11788426
申请日：2007-04-20
申请人： Hiroshi Tomiyasu , Teiichiro Umezawa , Genshichi Hata , Takashi Morikawa , Masato Kobayashi , Masashi Suzuki , Satoshi Yokota , Tsuyoshi Watanabe
发明人： Hiroshi Tomiyasu , Teiichiro Umezawa , Genshichi Hata , Takashi Morikawa , Masato Kobayashi , Masashi Suzuki , Satoshi Yokota , Tsuyoshi Watanabe
IPC分类号： G11B5/66
CPC分类号： G11B5/732 , G11B5/40 , G11B5/455 , G11B5/66 , G11B5/7325
摘要： There is disclosed a magnetic recording medium in which a seed layer, under layer, intermediate layer, first magnetic layer, nonmagnetic layer, second magnetic layer, protective layer, and lubricant layer are successively laminated on a glass substrate, the nonmagnetic layer is constituted of an alloy containing Cr and C, and the magnetic layer is constituted of an alloy containing Co and Pt. The under layer includes at least the seed layer for finely dividing the crystal particles of the magnetic layer, the seed layer includes at least two or more layers of nonmagnetic films, and the intermediate layer formed of the material different from that of the nonmagnetic film is interposed between the nonmagnetic films. In measurement of the thermal stability of the magnetic recording medium, a head is used, the head includes a read/write element, and a write track width is twice or more as large as a read track width in the head.
摘要翻译： 公开了一种磁性记录介质，其中在玻璃基板上依次层叠种子层，下层，中间层，第一磁性层，非磁性层，第二磁性层，保护层和润滑剂层，非磁性层由 含有Cr和C的合金，磁性层由含有Co和Pt的合金构成。 底层至少包括用于细分磁性层的晶粒的种子层，种子层包括至少两层或更多层非磁性膜，由不同于非磁性膜的材料形成的中间层是 介于非磁性膜之间。 在测量磁记录介质的热稳定性时，使用磁头，磁头包括读/写元件，写磁道宽度是磁头中读磁道宽度的两倍或更多。
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5.发明授权Substrate for an information recording medium, information recording medium using the substrate and method of producing the substrate 有权用于信息记录介质的基板，使用该基板的信息记录介质及其制造方法公开(公告)号：US06537648B1
公开(公告)日：2003-03-25
申请号：US09540887
申请日：2000-03-31
IPC分类号： G11B582
CPC分类号： G11B5/7315 , G11B23/0021 , Y10S428/90 , Y10T428/21 , Y10T428/24355
摘要： A substrate for an information recording medium has a microwaviness average height Ra′ not greater than 0.05 microinch as measured by a contactless laser interference technique for measurement points within a measurement region of 50 &mgr;m□-4 mm□ on a surface of the substrate. The microwaviness average height Ra′ is given by: Ra ′ = 1 n ∑ i = 1 n &LeftBracketingBar; x i - x _ &RightBracketingBar; , where xi represents a measurement point value of each measurement point, {overscore (x)} representing an average value of the measurement point values, n representing the number of said measurement points. Alternatively, the substrate has a waviness period between 300 &mgr;m and 5 mm and a waviness average height Wa of 1.0 nm or less as measured by the contactless laser interference technique for measurement points in a measurement region surrounded by two concentric circles which is spaced from a center of a surface of the substrate by a predetermined distance. The waviness average height Wa is given by: Wa = 1 N ∑ i = 1 N &LeftBracketingBar; X I - X _ &RightBracketingBar; where Xi represents a measurement point value of each measurement point, {overscore (X)} representing an average value of the measurement point values, n representing the number of said measurement points.
摘要翻译： 用于信息记录介质的基板具有通过非接触式激光干涉技术测量的微波平均高度Ra'不大于0.05微英寸，用于在基板的表面上的测量区域内的50mum-square-4mms的测量点。 微波平均高度Ra'由下式给出：其中xi表示每个测量点的测量点值，{overscore（x表示测量点值的平均值，n表示所述测量点的数量，或者，衬底具有 通过非接触式激光干涉技术测量的测量点在300mum至5mm之间的波纹度以及1.0nm或更小的波纹平均高度Wa，测量点由两个同心圆包围的测量点测量，该两个同心圆与表面的中心间隔开 波纹平均高度Wa由下式给出：其中Xi表示每个测量点的测量点值，（超标（X表示测量点值的平均值，n表示所述测量点的数量） 。
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