Scanned-beam imager with phase offset photon emission imaging
    1.
    发明授权
    Scanned-beam imager with phase offset photon emission imaging 有权
    扫描光束成像仪具有相位偏移光子发射成像

    公开(公告)号:US07375311B2

    公开(公告)日:2008-05-20

    申请号:US11384207

    申请日:2006-03-17

    IPC分类号: G02B7/04

    摘要: Aspects of the subject matter described herein relate to attributing light emissions to spots a light was scanned over. In aspects, the scanned light includes light capable of increasing light emissions from at least one type of matter. A detector detects emitted light that comes from spots the light was previously scanned over. Circuitry attributes emitted light with spots within the area. Data representing light that reflects from each spot may be combined with data representing light that emits (if any) from each spot to create an image. The emitted light may be assigned a false color in the image to distinguish it from reflected light in the image. Emitted light may occur as a result of fluorescent activity. Other aspects are described in the specification.

    摘要翻译: 本文描述的主题的方面涉及将光发射归因于扫描光的点。 在这些方面,扫描的光包括能够增加至少一种类型的物质的光发射的光。 检测器检测来自光先前扫描的光斑的发射光。 电路属性在区域内发光。 表示从每个点反射的光的数据可以与表示从每个点发射(如果有的话)的光的数据组合以创建图像。 发出的光可能在图像中被指定为假颜色,以将其与图像中的反射光区分开。 由于荧光活性,可能发生发光。 其他方面在说明书中描述。