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公开(公告)号：US20110134958A1
公开(公告)日：2011-06-09
申请号：US12901257
申请日：2010-10-08
申请人： Dhruv Arora , Ronald Marshall Bass , Graham Patrick Bradford , David Booth Burns , Eric Abreu Gesualdi , Scott Vinh Nguyen , Edward Everett de St. Remey , Stephen Taylor Thompson
发明人： Dhruv Arora , Ronald Marshall Bass , Graham Patrick Bradford , David Booth Burns , Eric Abreu Gesualdi , Scott Vinh Nguyen , Edward Everett de St. Remey , Stephen Taylor Thompson
IPC分类号： G01K13/00
CPC分类号： G01K11/06 , E21B43/24 , E21B43/295 , E21B47/065 , G01K2003/145
摘要： Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated conductor based on the one or more assessed dielectric properties.
摘要翻译： 本文描述了用于评估地下地层中的开口中的温度的方法。 方法可以包括沿着位于开口中的绝缘导体的长度评估一个或多个介电特性，并基于一个或多个评估的介电特性评估绝缘导体的长度上的一个或多个温度。
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公开(公告)号：US08356935B2
公开(公告)日：2013-01-22
申请号：US12901257
申请日：2010-10-08
申请人： Dhruv Arora , Ronald Marshall Bass , Graham Patrick Bradford , David Booth Burns , Eric Abreu Gesualdi , Scott Vinh Nguyen , Edward Everett de St. Remey , Stephen Taylor Thompson
发明人： Dhruv Arora , Ronald Marshall Bass , Graham Patrick Bradford , David Booth Burns , Eric Abreu Gesualdi , Scott Vinh Nguyen , Edward Everett de St. Remey , Stephen Taylor Thompson
IPC分类号： G01K13/00
CPC分类号： G01K11/06 , E21B43/24 , E21B43/295 , E21B47/065 , G01K2003/145
摘要： Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated conductor based on the one or more assessed dielectric properties.
摘要翻译： 本文描述了用于评估地下地层中的开口中的温度的方法。 方法可以包括沿着位于开口中的绝缘导体的长度评估一个或多个介电特性，并基于一个或多个评估的介电特性评估绝缘导体的长度上的一个或多个温度。
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