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公开(公告)号:US20060286912A1
公开(公告)日:2006-12-21
申请号:US11153685
申请日:2005-06-16
申请人: Yong Hu , Pranesh Swamy , Eric Dahlin , Hamid Ghazvini
发明人: Yong Hu , Pranesh Swamy , Eric Dahlin , Hamid Ghazvini
IPC分类号: B24D11/00
CPC分类号: B24B39/06 , Y10T29/49041
摘要: A hybrid burnishing head for processing of surfaces of hard disk media comprises a solid body including a first major surface and a second, opposed major surface comprising a burnishing surface including first and second surface portions, wherein the first surface portion is configured for providing air bearing stability and flyability of the head over the media surface, the second surface portion is configured for providing burnishing of a media surface, and the first and second surface portions are operatively decoupled for simultaneously providing optimized air bearing stability/flyability and burnishing aggressiveness for a particular application.
摘要翻译: 用于处理硬盘介质表面的混合抛光头包括固体,其包括第一主表面和第二相对主表面,所述主表面包括包括第一和第二表面部分的抛光表面,其中所述第一表面部分构造成用于提供空气轴承 头部在介质表面上的稳定性和可飞行性,第二表面部分构造成用于提供介质表面的抛光,并且第一和第二表面部分被可操作地分离,以同时提供优化的空气轴承的稳定性/可飞行性和对特定的 应用。
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公开(公告)号:US20050022586A1
公开(公告)日:2005-02-03
申请号:US10628390
申请日:2003-07-29
申请人: Yong Hu , Eric Dahlin , Shih-Fu Lee , Hamid Ghazvini , Elias Johnson
发明人: Yong Hu , Eric Dahlin , Shih-Fu Lee , Hamid Ghazvini , Elias Johnson
CPC分类号: G11B5/455
摘要: A system and a method for measuring micro-waviness of a magnetic recording disk using a high-speed glide test are disclosed. The HSG test is a viable production-level test methodology for high performance media that require well-controlled and low micro-waviness.
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公开(公告)号:US08619528B2
公开(公告)日:2013-12-31
申请号:US13223199
申请日:2011-08-31
申请人: Hamid Ghazvini , David Kuo , Minh Huong Le , Kim Yang Lee , HongYing Wang , Nobuo Kurataka , Yautzong Hsu , Henry Hung Yang
发明人: Hamid Ghazvini , David Kuo , Minh Huong Le , Kim Yang Lee , HongYing Wang , Nobuo Kurataka , Yautzong Hsu , Henry Hung Yang
IPC分类号: G11B20/00
CPC分类号: G06K5/00 , G11B5/746 , G11B5/82 , G11B5/84 , G11B5/855 , G11B20/182 , G11B27/36 , G11B2220/2516
摘要: A system and method of calibrating optical measuring equipment includes optically measuring discrete objects of a first known predictable pattern from a calibration apparatus, wherein the first known predictable pattern is a bit pattern. A recording surface optical reader is calibrated based on the optically measuring. Using the first known predictable pattern, contamination is filtered from the results of the optically measuring.
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公开(公告)号:US20130051206A1
公开(公告)日:2013-02-28
申请号:US13223199
申请日:2011-08-31
申请人: Hamid Ghazvini , David Kuo , Minh Huong Le , Kim Yang Lee , HongYing Wang , Nobuo Kurataka , Yautzong Hsu , Henry Hung Yang
发明人: Hamid Ghazvini , David Kuo , Minh Huong Le , Kim Yang Lee , HongYing Wang , Nobuo Kurataka , Yautzong Hsu , Henry Hung Yang
CPC分类号: G06K5/00 , G11B5/746 , G11B5/82 , G11B5/84 , G11B5/855 , G11B20/182 , G11B27/36 , G11B2220/2516
摘要: A system and method of calibrating optical measuring equipment includes optically measuring discrete objects of a first known predictable pattern from a calibration apparatus, wherein the first known predictable pattern is a bit pattern. A recording surface optical reader is calibrated based on the optically measuring. Using the first known predictable pattern, contamination is filtered from the results of the optically measuring.
摘要翻译: 校准光学测量设备的系统和方法包括从校准装置光学测量第一已知可预测图案的离散物体,其中第一已知可预测图案是位图案。 基于光学测量校准记录表面光学读取器。 使用第一已知的可预测模式,从光学测量的结果中滤去污染物。
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