公开(公告)号：US5394481A

公开(公告)日：1995-02-28

申请号：US820925

申请日：1992-01-15

申请人： Ryohei Kumagai ,  Kaoru Hiiro ,  Harumi Shimizu ,  Manabu Oosaka ,  Tooru Takahashi

发明人： Ryohei Kumagai ,  Kaoru Hiiro ,  Harumi Shimizu ,  Manabu Oosaka ,  Tooru Takahashi

IPC分类号： G01N21/88 ,  G01N21/95 ,  G06K9/00 ,  G06K9/20 ,  G06K9/48

CPC分类号： G01N21/88 ,  G01N2021/9513

摘要： A method of inspecting a liquid crystal panel and determining the type of defect. Each part of the liquid crystal panel is extracted and inspected by comparison with an extracted reference part. The parts to be inspected may be found based on the location of previously found parts or by examining a plot of the density in the image. Vector data from a part that is known to be defectless is used to extract the reference part. Alternatively, the contour of a reference part may be determined by analyzing the vector data which was obtained for the parts to be inspected. The type of defect is determined by classifying the defective part according to characteristics of the part's image (e.g., brightness of the pixels) as compared with parts having known defects.

摘要翻译： 一种检查液晶面板并确定缺陷类型的方法。 通过与提取的参考部分的比较来提取和检查液晶面板的每个部分。 要检查的部件可以基于先前找到的部件的位置或通过检查图像中的密度的图来找到。 来自已知无缺陷部分的矢量数据用于提取参考部分。 或者，参考部分的轮廓可以通过分析对于被检查部件获得的矢量数据来确定。 与具有已知缺陷的部件相比，通过根据部件图像的特性（例如，像素的亮度）对缺陷部分进行分类来确定缺陷的类型。

公开(公告)号：US5339093A

公开(公告)日：1994-08-16

申请号：US801356

申请日：1991-12-02

申请人： Eryohei Kumagai ,  Kaoru Hiiro ,  Harumi Shimizu ,  Tooru Takahashi

发明人： Eryohei Kumagai ,  Kaoru Hiiro ,  Harumi Shimizu ,  Tooru Takahashi

IPC分类号： G01M11/00 ,  G01N21/95 ,  G01N21/956 ,  G02F1/13 ,  G09G3/36

CPC分类号： G01N21/95607 ,  G01N2021/9513 ,  Y10S345/904

摘要： The present invention makes it possible for unskilled to inspect the total surface of a liquid crystal panel accurately in short time. It is defined that a liquid crystal panel can be divided into a single part which is a constituent, isolable, and an inspectable area, and that the single part to be "unit area of image" which is defined as a pattern to be inspected. Before the inspection, a unit area of an image without defect is selected from a liquid crystal panel to be inspected. The upper limit reference pattern and the lower limit reference pattern are generated by giving the maximal brightness in a convolution and adding the predetermined brightness and by giving the minimal brightness in the convolution and subtracting the predetermined brightness, respectively, to each pixel of the convolution. Comparing a brightness of each pixel of the upper limit and the lower limit reference pattern with a brightness of a pixel of a pattern to be inspected corresponding to it, the liquid crystal panel to be inspected is judged to be up to standard when more than a predetermined number of pixels are within the range between the upper limit and the lower limit brightness of the reference pattern.

摘要翻译： 本发明使得无需熟练地在短时间内精确地检查液晶面板的总表面成为可能。 定义为可以将液晶面板划分为构成，可隔离和可检查区域的单个部分，并且将被定义为待检查图案的“单位图像区域”的单个部分划分为单个部分。 在检查之前，从要检查的液晶面板中选择没有缺陷的图像的单位面积。 通过给出卷积中的最大亮度并添加预定亮度并且通过给出卷积中的最小亮度并分别将卷积的每个像素减去预定亮度来生成上限参考图案和下限参考图案。 将上限和下限参考图案的每个像素的亮度与对应于待检查图案的像素的亮度进行比较，当被检查的液晶面板多于一个 预定数量的像素在参考图案的上限和下限亮度之间的范围内。