Method and apparatus for determining a substrate exchange position in a processing system
    1.
    发明授权
    Method and apparatus for determining a substrate exchange position in a processing system 失效
    用于确定处理系统中的基板交换位置的方法和装置

    公开(公告)号:US07505832B2

    公开(公告)日:2009-03-17

    申请号:US10802363

    申请日:2004-03-16

    IPC分类号: G05B15/00 G05B19/00

    摘要: Embodiments of a method and apparatus for determining a substrate exchange position in a processing system are provided. In one embodiment, a method of determining a substrate exchange position in a processing system includes determining an initial exchange position within a processing chamber, and resolving a change in the exchange position. The step of resolving may further include the step of sensing a change in temperature of a facet of a transfer chamber having the processing chamber coupled thereto, sensing a change in a state of the system, or sensing a change in position of the processing chamber, among others.

    摘要翻译: 提供了一种用于确定处理系统中的基板交换位置的方法和装置的实施例。 在一个实施例中,确定处理系统中的基板交换位置的方法包括确定处理室内的初始交换位置,以及解决交换位置的变化。 分辨步骤可进一步包括检测具有与其耦合的处理室的传送室的面的温度变化的步骤,感测系统的状态的变化或感测处理室的位置的改变, 等等