Manufacturing method power semiconductor device
    1.
    发明授权
    Manufacturing method power semiconductor device 有权
    制造方法功率半导体器件

    公开(公告)号:US08709895B2

    公开(公告)日:2014-04-29

    申请号:US13038346

    申请日:2011-03-01

    IPC分类号: H01L21/336

    摘要: The present invention provides a termination structure of a power semiconductor device and a manufacturing method thereof. The power semiconductor device has an active region and a termination region. The termination region surrounds the active region, and the termination structure is disposed in the termination region. The termination structure includes a semiconductor substrate, an insulating layer and a metal layer. The semiconductor substrate has a trench disposed in the termination region. The insulating layer is partially filled into the trench and covers the semiconductor substrate, and a top surface of the insulating layer has a hole. The metal layer is disposed on the insulating layer, and is filled into the hole.

    摘要翻译: 本发明提供一种功率半导体器件的端接结构及其制造方法。 功率半导体器件具有有源区和端接区。 终端区域围绕有源区域,终端结构设置在终端区域中。 端接结构包括半导体衬底,绝缘层和金属层。 半导体衬底具有设置在终端区域中的沟槽。 绝缘层部分地填充到沟槽中并且覆盖半导体衬底,并且绝缘层的顶表面具有孔。 金属层设置在绝缘层上,并被填充到孔中。

    TERMINATION STRUCTURE OF POWER SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
    3.
    发明申请
    TERMINATION STRUCTURE OF POWER SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF 有权
    功率半导体器件的终止结构及其制造方法

    公开(公告)号:US20120112268A1

    公开(公告)日:2012-05-10

    申请号:US13038346

    申请日:2011-03-01

    摘要: The present invention provides a termination structure of a power semiconductor device and a manufacturing method thereof. The power semiconductor device has an active region and a termination region. The termination region surrounds the active region, and the termination structure is disposed in the termination region. The termination structure includes a semiconductor substrate, an insulating layer and a metal layer. The semiconductor substrate has a trench disposed in the termination region. The insulating layer is partially filled into the trench and covers the semiconductor substrate, and a top surface of the insulating layer has a hole. The metal layer is disposed on the insulating layer, and is filled into the hole.

    摘要翻译: 本发明提供一种功率半导体器件的端接结构及其制造方法。 功率半导体器件具有有源区和端接区。 终端区域围绕有源区域,终端结构设置在终端区域中。 端接结构包括半导体衬底,绝缘层和金属层。 半导体衬底具有设置在终端区域中的沟槽。 绝缘层部分地填充到沟槽中并且覆盖半导体衬底,并且绝缘层的顶表面具有孔。 金属层设置在绝缘层上,并被填充到孔中。