Method and apparatus for probe tip contact
    1.
    发明申请
    Method and apparatus for probe tip contact 有权
    探针尖端接触的方法和装置

    公开(公告)号:US20060103400A1

    公开(公告)日:2006-05-18

    申请号:US10987353

    申请日:2004-11-12

    IPC分类号: G01R31/02

    CPC分类号: G01R31/2831

    摘要: The invention is a method and apparatus for a probe tip contact for electrically coupling a substrate to a probe tip. The apparatus, in one embodiment, comprises a wrap-around contact that is precision formed utilizing a hydroform tool and brazed to a surface of a substrate. In another embodiment, the apparatus comprises a contact flange, a mounting flange extending from a first edge of the contact flange in an orientation substantially perpendicular to the contact flange, and a substantially circular indentation formed in the contact flange adapted for accommodating movement of said probe tip relative to said substrate.

    摘要翻译: 本发明是用于将衬底电耦合到探针尖端的探针尖端接触的方法和装置。 在一个实施例中,该装置包括使用液压工具精确地形成并钎焊到基底表面的环绕接触。 在另一个实施例中,该装置包括接触凸缘,从接触凸缘的第一边缘以基本上垂直于接触凸缘的方向延伸的安装凸缘,以及形成在接触凸缘中的大致圆形的凹口,适于容纳所述探头的运动 尖端相对于所述衬底。