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公开(公告)号:US5323267A
公开(公告)日:1994-06-21
申请号:US815960
申请日:1992-01-02
申请人: Pierre Galarneau , Pierre Langlois , Michel Belanger , Julie Frechette , Jean-Marie Trudeau , Marie Cote
发明人: Pierre Galarneau , Pierre Langlois , Michel Belanger , Julie Frechette , Jean-Marie Trudeau , Marie Cote
CPC分类号: G02B27/1093 , G01J1/4257 , G02B27/1006 , G02B27/108 , G02B27/1086 , G02B5/1871 , H01S3/0014
摘要: A beam sampler comprises a substrate made of highly transparent fused silica or zinc selenide, both capable of sustaining high power laser beams. The substrate defines an outer surface through which the light beam being sampled propagates. A sinusoidal diffracting relief is etched on this outer surface directly into the light-propagating material of the substrate. When a light beam propagates through the outer surface of the substrate, the three-dimensional diffracting relief extracts from this light beam at least one pair of low power beam samples.
摘要翻译: 光束取样器包括由高透明度的熔融石英或硒化锌制成的基板,两者都能够维持高功率的激光束。 衬底限定外部表面,被采样的光束通过该外表面传播。 在该外表面上直接蚀刻到基板的光传播材料中的正弦衍射浮雕。 当光束传播通过衬底的外表面时,三维衍射浮雕从该光束提取至少一对低功率光束样本。