Method of holding an electronic component in a controlled orientation during parametric testing
    1.
    发明授权
    Method of holding an electronic component in a controlled orientation during parametric testing 有权
    在参数测试期间将电子部件保持在受控方向的方法

    公开(公告)号:US07161346B2

    公开(公告)日:2007-01-09

    申请号:US11135728

    申请日:2005-05-23

    CPC classification number: G01R31/016

    Abstract: A component handler includes an improved test seat having a shape that ensures that an electronic component seated in the test seat is in an appropriate orientation for parametric testing. The test seat has a base surface and first and second opposed seat side surfaces separated by generally increasing distances from a narrower notch end to a wider notch end. There is an opening at the narrower notch end. An electronic component is seated within this test seat such that the first and second side surfaces of the electronic component rest against the first and second seat side surfaces. A side surface side margin on which is formed a wraparound electrode is exposed by an opening at the narrower notch end and a second side surface side margin on which is formed a second wraparound electrode is exposed by an opening at the wider notch end.

    Abstract translation: 组件处理器包括改进的测试座,其具有确保安装在测试座中的电子组件处于适当方向用于参数测试的形状。 测试座具有基部表面和第一和第二相对的座侧表面,其间距较窄的切口端至更宽的切口端的距离大致增加。 狭窄的一端有一个开口。 电子部件安置在该测试座内,使得电子部件的第一和第二侧表面抵靠第一和第二座椅侧表面。 形成环绕电极的侧面侧边缘由较窄的切口端处的开口露出,形成第二环绕电极的第二侧面侧边缘由较宽的切口端的开口露出。

    METHOD OF HOLDING AN ELECTRONIC COMPONENT IN A CONTROLLED ORIENTATION DURING PARAMETRIC TESTING
    3.
    发明申请
    METHOD OF HOLDING AN ELECTRONIC COMPONENT IN A CONTROLLED ORIENTATION DURING PARAMETRIC TESTING 有权
    在参数测试期间将电子元件保持在受控方向的方法

    公开(公告)号:US20060261832A1

    公开(公告)日:2006-11-23

    申请号:US11135728

    申请日:2005-05-23

    CPC classification number: G01R31/016

    Abstract: A component handler includes an improved test seat having a shape that ensures that an electronic component seated in the test seat is in an appropriate orientation for parametric testing. The test seat has a base surface and first and second opposed seat side surfaces separated by generally increasing distances from a narrower notch end to a wider notch end. There is an opening at the narrower notch end. An electronic component is seated within this test seat such that the first and second side surfaces of the electronic component rest against the first and second seat side surfaces. A side surface side margin on which is formed a wraparound electrode is exposed by an opening at the narrower notch end and a second side surface side margin on which is formed a second wraparound electrode is exposed by an opening at the wider notch end.

    Abstract translation: 组件处理器包括改进的测试座,其具有确保安装在测试座中的电子组件处于适当方向用于参数测试的形状。 测试座具有基部表面和第一和第二相对的座侧表面,其间距较窄的切口端至更宽的切口端的距离大致增加。 狭窄的一端有一个开口。 电子部件安置在该测试座内,使得电子部件的第一和第二侧表面抵靠第一和第二座椅侧表面。 形成环绕电极的侧面侧边缘由较窄的切口端处的开口露出,形成第二环绕电极的第二侧面侧边缘由较宽的切口端的开口露出。

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