公开(公告)号：US20100066357A1

公开(公告)日：2010-03-18

申请号：US12560303

申请日：2009-09-15

申请人： Fred M. Mueller ,  Jens Haenisch

发明人： Fred M. Mueller ,  Jens Haenisch

IPC分类号： G01R33/02

CPC分类号： G01R33/1246

摘要： The transverse critical-current uniformity in a superconducting tape was determined using a magnetic knife apparatus. A critical current Ic distribution and transverse critical current density Jc distribution in YBCO coated conductors was measured nondestructively with high resolution using a magnetic knife apparatus. The method utilizes the strong depression of Jc in applied magnetic fields. A narrow region of low, including zero, magnetic field in a surrounding higher field is moved transversely across a sample of coated conductor. This reveals the critical current density distribution. A Fourier series inversion process was used to determine the transverse Jc distribution in the sample.

摘要翻译： 使用磁刀装置测定超导带中的横向临界电流均匀性。 使用磁刀设备以高分辨率非破坏性地测量YBCO涂层导体中的临界电流Ic分布和横向临界电流密度Jc分布。 该方法利用了施加磁场中Jc的强抑制。 在周围的较高场中的包括零磁场的窄区域横向移动穿过涂覆导体的样品。 这揭示了临界电流密度分布。 使用傅里叶级数反演方法确定样品中的横向Jc分布。

公开(公告)号：US08228055B2

公开(公告)日：2012-07-24

申请号：US12560303

申请日：2009-09-15

申请人： Fred M. Mueller ,  Jens Haenisch

发明人： Fred M. Mueller ,  Jens Haenisch

IPC分类号： G01P3/48

CPC分类号： G01R33/1246

摘要： The transverse critical-current uniformity in a superconducting tape was determined using a magnetic knife apparatus. A critical current Ic distribution and transverse critical current density Jc distribution in YBCO coated conductors was measured nondestructively with high resolution using a magnetic knife apparatus. The method utilizes the strong depression of Jc in applied magnetic fields. A narrow region of low, including zero, magnetic field in a surrounding higher field is moved transversely across a sample of coated conductor. This reveals the critical current density distribution. A Fourier series inversion process was used to determine the transverse Jc distribution in the sample.

摘要翻译： 使用磁刀装置测定超导带中的横向临界电流均匀性。 使用磁刀设备以高分辨率非破坏性地测量YBCO涂层导体中的临界电流Ic分布和横向临界电流密度Jc分布。 该方法利用了施加磁场中Jc的强抑制。 在周围的较高场中的包括零磁场的窄区域横向移动穿过涂覆导体的样品。 这显示了临界电流密度分布。 使用傅里叶级数反演方法确定样品中的横向Jc分布。