公开(公告)号：US06807323B2

公开(公告)日：2004-10-19

申请号：US10090305

申请日：2002-03-04

申请人： Shin Yong Beom ,  Hyeon-Bong Pyo ,  Jiwook Jeong ,  Lee Sang-Kyung ,  Dong Ho Shin ,  Min-Gon Kim ,  Park Seon Hee

发明人： Shin Yong Beom ,  Hyeon-Bong Pyo ,  Jiwook Jeong ,  Lee Sang-Kyung ,  Dong Ho Shin ,  Min-Gon Kim ,  Park Seon Hee

IPC分类号： G02B600

CPC分类号： G01N21/648 ,  B82Y20/00 ,  G01N21/645 ,  G02B6/1226 ,  G02B6/134

摘要： An active ion-doped waveguide-plasmon resonance (AID WPR) sensor based on plasmon surface resonance (PSR) and an imaging system using the sensor are provided. An additional dielectric thin film doped with active ions and acting as a waveguide is formed on a metal thin film. The active ions are excited by an incident light beam and fluoresce light of a shorter wavelength than the incident light beam through upconversion coupled to surface plasmon resonance, thereby increasing fluorescence intensity variations with respect to incident light angle variations. The AID WPR sensor and the imaging system can detect a minor refractive index variation of a sample, which could not be measured using an existing SPR sensor, or a trace adsorbed material, with 100 times larger refractive index resolution than the existing SPR sensor.

摘要翻译： 提供了基于等离子体表面共振（PSR）的主动离子掺杂波导 - 等离子体共振（AID WPR）传感器和使用传感器的成像系统。 掺杂有活性离子并用作波导的附加电介质薄膜形成在金属薄膜上。 活性离子被入射光束激发，并且通过耦合到表面等离子体共振的上变频而发射比入射光束更短波长的光，从而增加相对于入射光角变化的荧光强度变化。 AID WPR传感器和成像系统可以检测样品的较小的折射率变化，使用现有SPR传感器或痕量吸附材料无法测量，其折射率分辨率高于现有SPR传感器的100倍。