公开(公告)号：US08536544B2

公开(公告)日：2013-09-17

申请号：US12970110

申请日：2010-12-16

申请人： James Kell ,  John C. C. Day

发明人： James Kell ,  John C. C. Day

IPC分类号： G01J1/58 ,  G01B15/02 ,  C23C14/54

CPC分类号： G01B11/0658 ,  G01N21/63 ,  G01N21/8422

摘要： Provided is a method for determining the presence of an alumina layer on a surface of a component. The method includes illuminating a surface of a component with radiation; detecting radiation emitted at a particular wavelength; analyzing the detected radiation; to determine the thickness of the alumina at at least one point on the surface of the component; and comparing the determined thickness of the alumina at the at least one point on the surface of the component with a predetermined thickness of alumina at that point to decide if the thickness of alumina at the at least one point on the surface of the component is satisfactory.

摘要翻译： 提供了一种用于确定部件表面上的氧化铝层的存在的方法。 该方法包括用辐射照射部件的表面; 检测在特定波长处发射的辐射; 分析检测到的辐射; 确定组件表面上至少一个点处氧化铝的厚度; 并且将该组分表面上至少一个点处的氧化铝的确定厚度与该点处的预定厚度的氧化铝进行比较，以确定组件表面上至少一个点处氧化铝的厚度是否令人满意 。