Lithographic Processing Method, and Device Manufactured Thereby
    1.
    发明申请
    Lithographic Processing Method, and Device Manufactured Thereby 失效
    平版印刷加工方法和制造的装置

    公开(公告)号:US20120208113A1

    公开(公告)日:2012-08-16

    申请号:US13455103

    申请日:2012-04-24

    IPC分类号: G03F7/20 G03F1/68 G03F1/00

    摘要: A method of splitting a lithographic pattern into two sub-patterns, includes generating test structures corresponding to structures of interest in the lithographic pattern, varying the test structures through a selected range of dimensions, simulating an image of the test structures, determining an image quality metric for the simulated image, analyzing the determined image quality metric to determine pitch ranges for which split improves the image quality metric and ranges for which split does not improve the image quality metric, and generating the two sub-patterns in accordance with the determined pitch ranges.

    摘要翻译: 将光刻图案分割为两个子图案的方法包括产生对应于光刻图案中感兴趣的结构的测试结构,通过选择的尺寸范围改变测试结构,模拟测试结构的图像,确定图像质量 测量模拟图像,分析所确定的图像质量度量以确定分割的音调范围改善图像质量度量和分割的范围不改善图像质量度量,并且根据确定的音调生成两个子模式 范围。

    Lithographic processing method, and device manufactured thereby
    2.
    发明授权
    Lithographic processing method, and device manufactured thereby 失效
    平版印刷加工方法及其制造的装置

    公开(公告)号:US08486589B2

    公开(公告)日:2013-07-16

    申请号:US13455103

    申请日:2012-04-24

    IPC分类号: G03F1/44

    摘要: A method of splitting a lithographic pattern into two sub-patterns, includes generating test structures corresponding to structures of interest in the lithographic pattern, varying the test structures through a selected range of dimensions, simulating an image of the test structures, determining an image quality metric for the simulated image, analyzing the determined image quality metric to determine pitch ranges for which split improves the image quality metric and ranges for which split does not improve the image quality metric, and generating the two sub-patterns in accordance with the determined pitch ranges.

    摘要翻译: 将光刻图案分割为两个子图案的方法包括产生对应于光刻图案中感兴趣的结构的测试结构,通过选择的尺寸范围改变测试结构,模拟测试结构的图像,确定图像质量 测量模拟图像,分析所确定的图像质量度量以确定分割的音调范围改善图像质量度量和分割的范围不改善图像质量度量,并且根据确定的音调生成两个子模式 范围。

    Lithographic processing method, and device manufactured thereby
    3.
    发明授权
    Lithographic processing method, and device manufactured thereby 有权
    平版印刷加工方法及其制造的装置

    公开(公告)号:US08182969B2

    公开(公告)日:2012-05-22

    申请号:US12567514

    申请日:2009-09-25

    IPC分类号: G03F9/00

    摘要: A method of splitting a lithographic pattern into two sub-patterns, includes generating test structures corresponding to structures of interest in the lithographic pattern, varying the test structures through a selected range of dimensions, simulating an image of the test structures, determining an image quality metric for the simulated image, analyzing the determined image quality metric to determine pitch ranges for which split improves the image quality metric and ranges for which split does not improve the image quality metric, and generating the two sub-patterns in accordance with the determined pitch ranges.

    摘要翻译: 将光刻图案分割为两个子图案的方法包括产生对应于光刻图案中感兴趣的结构的测试结构,通过选择的尺寸范围改变测试结构,模拟测试结构的图像,确定图像质量 测量模拟图像,分析所确定的图像质量度量以确定分割的音调范围改善图像质量度量和分割的范围不改善图像质量度量,并且根据确定的音调生成两个子模式 范围。

    LITHOGRAPHIC PROCESSING METHOD, AND DEVICE MANUFACTURED THEREBY
    4.
    发明申请
    LITHOGRAPHIC PROCESSING METHOD, AND DEVICE MANUFACTURED THEREBY 有权
    LITHOGRAPHIC PROCESSING方法及其制造的器件

    公开(公告)号:US20100086863A1

    公开(公告)日:2010-04-08

    申请号:US12567514

    申请日:2009-09-25

    IPC分类号: G03F7/20 G03F1/00

    摘要: A method of splitting a lithographic pattern into two sub-patterns, includes generating test structures corresponding to structures of interest in the lithographic pattern, varying the test structures through a selected range of dimensions, simulating an image of the test structures, determining an image quality metric for the simulated image, analyzing the determined image quality metric to determine pitch ranges for which split improves the image quality metric and ranges for which split does not improve the image quality metric, and generating the two sub-patterns in accordance with the determined pitch ranges.

    摘要翻译: 将光刻图案分割为两个子图案的方法包括产生对应于光刻图案中感兴趣的结构的测试结构,通过选择的尺寸范围改变测试结构,模拟测试结构的图像,确定图像质量 测量模拟图像,分析所确定的图像质量度量以确定分割的音调范围改善图像质量度量和分割的范围不改善图像质量度量,并且根据确定的音调生成两个子模式 范围。