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1.发明申请REGISTRATION OF AN EXTENDED REFERENCE FOR PARAMETER MEASUREMENT IN AN OPTICAL SENSING SYSTEM 有权在光学传感系统中注册参考测量的扩展参考公开(公告)号：US20110317148A1
公开(公告)日：2011-12-29
申请号：US13149206
申请日：2011-05-31
申请人： Mark E. FROGGATT , Justin W. KLEIN , Dawn K. GIFFORD , Matthew REAVES , Joseph J. BOS , Alexander K. SANG
发明人： Mark E. FROGGATT , Justin W. KLEIN , Dawn K. GIFFORD , Matthew REAVES , Joseph J. BOS , Alexander K. SANG
CPC分类号： G01B11/161 , G01D5/35316 , G01D5/35361 , G01L1/242
摘要： An interferometric measurement system measures a parameter using at least one optical waveguide. A memory stores reference interferometric pattern data associated with a segment of the optical waveguide. Interferometric detection circuitry detects and stores measurement interferometric pattern data associated with the segment of the optical waveguide during a measurement operation. A spectral range of the reference interferometric pattern of the optical waveguide is greater than a spectral range of the measurement interferometric pattern of the optical waveguide. A processor shifts one or both of the measurement interferometric pattern data and the reference interferometric pattern data relative to the other to obtain a match and to use the match to measure the parameter. An example parameter is strain.
摘要翻译： 干涉测量系统使用至少一个光波导测量参数。 存储器存储与光波导的段相关联的参考干涉图案数据。 干涉测量电路在测量操作期间检测和存储与光波导段相关联的测量干涉图案数据。 光波导的参考干涉图案的光谱范围大于光波导的测量干涉图案的光谱范围。 处理器相对于另一个处理器移动测量干涉图案数据和参考干涉图案数据中的一个或两个以获得匹配并且使用该匹配来测量该参数。 示例参数是应变。
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2.发明授权Registration of an extended reference for parameter measurement in an optical sensing system 有权在光学传感系统中注册参数测量的扩展参考公开(公告)号：US08400620B2
公开(公告)日：2013-03-19
申请号：US13149206
申请日：2011-05-31
申请人： Mark E. Froggatt , Justin W. Klein , Dawn K. Gifford , Matthew Reaves , Joseph J. Bos , Alexander K. Sang
发明人： Mark E. Froggatt , Justin W. Klein , Dawn K. Gifford , Matthew Reaves , Joseph J. Bos , Alexander K. Sang
CPC分类号： G01B11/161 , G01D5/35316 , G01D5/35361 , G01L1/242
摘要： An interferometric measurement system measures a parameter using at least one optical waveguide. A memory stores reference interferometric pattern data associated with a segment of the optical waveguide. Interferometric detection circuitry detects and stores measurement interferometric pattern data associated with the segment of the optical waveguide during a measurement operation. A spectral range of the reference interferometric pattern of the optical waveguide is greater than a spectral range of the measurement interferometric pattern of the optical waveguide. A processor shifts one or both of the measurement interferometric pattern data and the reference interferometric pattern data relative to the other to obtain a match and to use the match to measure the parameter. An example parameter is strain.
摘要翻译： 干涉测量系统使用至少一个光波导测量参数。 存储器存储与光波导的段相关联的参考干涉图案数据。 干涉测量电路在测量操作期间检测和存储与光波导段相关联的测量干涉图案数据。 光波导的参考干涉图案的光谱范围大于光波导的测量干涉图案的光谱范围。 处理器相对于另一个处理器移动测量干涉图案数据和参考干涉图案数据中的一个或两个以获得匹配并且使用该匹配来测量该参数。 示例参数是应变。
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