Pressure measuring material
    2.
    发明授权

    公开(公告)号:US12092537B2

    公开(公告)日:2024-09-17

    申请号:US18357182

    申请日:2023-07-24

    CPC classification number: G01L1/247 G01L1/242

    Abstract: Provided is a pressure measuring material having a substrate and a pressure-sensitive layer, wherein the pressure-sensitive layer contains a polymer matrix containing a polymer compound having a molecular weight of 1,000 or more, and microcapsules encapsulating an electron-donating dye precursor and a solvent, and an electron-accepting compound. The pressure-sensitive layer has a color development-inducing layer having the electron-accepting compound and the polymer matrix and a color-developing layer having the microcapsules. A thickness of the color-developing layer is equal to or less than ½ of a thickness of the color development-inducing layer.

    WALL SHEAR STRESS SENSOR
    7.
    发明公开

    公开(公告)号:US20240068892A1

    公开(公告)日:2024-02-29

    申请号:US18272269

    申请日:2021-12-14

    CPC classification number: G01L1/242

    Abstract: A two-dimensional wall shear stress sensor comprising fixed and floating substrates, an incident light source and first and second photodetectors. The fixed substrate supports a first plurality of optical gratings. The floating substrate supports a second plurality of optical gratings superimposed over the first plurality of optical gratings to form a plurality of Moire fringe patterns comprising at least a first Moire fringe pattern extending in a first direction and a second Moire fringe pattern extending in a second direction different to the first direction. The floating substrate is displaceable relative to the fixed substrate in response to a wall shear stress imparted on the sensor, wherein displacement of the floating substrate correlates with a phase shift in at least one of the first and second Moire fringe patterns. An incident light source is configured to illuminate each of the plurality of Moire fringe patterns. The first photodetector system is configured to detect intensity of light reflected from the first Moire fringe pattern. The second photodetector system is configured to

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