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公开(公告)号：US20060253758A1
公开(公告)日：2006-11-09
申请号：US11315595
申请日：2005-12-23
CPC分类号： G01R31/3187 , G01R31/317 , G01R31/31715 , G01R31/31716
摘要： A semiconductor device includes an output path; an input path; and a test signal generating circuit. The test signal generating circuit generates an input test data signal by changing at least one of an amplitude and a phase of an output test data signal which is generated from a test data in the semiconductor device and transferred on the output path, and supplies the input test data signal onto the input path. The output path and the input path are tested by using the output test data signal and the input test data signal, respectively.
摘要翻译： 半导体器件包括输出路径; 输入路径 和测试信号发生电路。 测试信号产生电路通过改变从半导体器件中的测试数据产生并在输出路径上传送的输出测试数据信号的幅度和相位中的至少一个来产生输入测试数据信号，并将输入 测试数据信号到输入路径上。 通过使用输出测试数据信号和输入测试数据信号来测试输出路径和输入路径。
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公开(公告)号：US07401276B2
公开(公告)日：2008-07-15
申请号：US11315595
申请日：2005-12-23
CPC分类号： G01R31/3187 , G01R31/317 , G01R31/31715 , G01R31/31716
摘要： A semiconductor device includes an output path; an input path; and a test signal generating circuit. The test signal generating circuit generates an input test data signal by changing at least one of an amplitude and a phase of an output test data signal which is generated from a test data in the semiconductor device and transferred on the output path, and supplies the input test data signal onto the input path. The output path and the input path are tested by using the output test data signal and the input test data signal, respectively.
摘要翻译： 半导体器件包括输出路径; 输入路径 和测试信号发生电路。 测试信号产生电路通过改变从半导体器件中的测试数据产生并在输出路径上传送的输出测试数据信号的幅度和相位中的至少一个来产生输入测试数据信号，并将输入 测试数据信号到输入路径上。 通过使用输出测试数据信号和输入测试数据信号来测试输出路径和输入路径。
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