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1.发明授权Small form-factor keyboard using keys with offset peaks and pitch variations 失效小尺寸键盘使用具有偏移峰值和间距变化的键公开(公告)号：US07394030B2
公开(公告)日：2008-07-01
申请号：US11144098
申请日：2005-06-02
IPC分类号： H01H13/70
CPC分类号： G06F1/1662 , G06F1/1626 , G06F3/0202 , G06F3/0219 , H01H13/84 , H01H2217/004 , H04M1/23 , H04M1/72547 , H04M2250/70
摘要： A small form-factor keyboard or keypad for key structures is provided in which individual key structures have a contact surface on which there is a center reference and a peak. The center reference and the peak or offset, so that an offset distance between the center reference and the peak is greater than or equal to zero. The offset distance for at least two or more key structures in the plurality of key structures may different. The difference in the offset distance may be based on a position of the individual key structures relative to a first reference line.
摘要翻译： 提供了一种用于键结构的小尺寸键盘或键盘，其中单个键结构具有接触表面，在该接触表面上存在中心参考和峰值。 中心参考和峰值或偏移，使得中心参考和峰值之间的偏移距离大于或等于零。 多个键结构中的至少两个或多个键结构的偏移距离可以不同。 偏移距离的差异可以基于各个键结构相对于第一参考线的位置。
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2.发明授权Small form-factor keyboard using keys with offset peaks and pitch variations 有权小尺寸键盘使用具有偏移峰值和间距变化的键公开(公告)号：US07741570B2
公开(公告)日：2010-06-22
申请号：US12128455
申请日：2008-05-28
IPC分类号： H01H13/70
CPC分类号： G06F1/1662 , G06F1/1626 , G06F3/0202 , G06F3/0219 , H01H13/84 , H01H2217/004 , H04M1/23 , H04M1/72547 , H04M2250/70
摘要： A small form-factor keyboard or keypad for key structures is provided in which individual key structures have a contact surface on which there is a center reference and a peak. The center reference and the peak or offset, so that an offset distance between the center reference and the peak is greater than or equal to zero. The offset distance for at least two or more key structures in the plurality of key structures may different. The difference in the offset distance may be based on a position of the individual key structures relative to a first reference line.
摘要翻译： 提供了一种用于键结构的小尺寸键盘或键盘，其中单个键结构具有接触表面，在该接触表面上存在中心参考和峰值。 中心参考和峰值或偏移，使得中心参考和峰值之间的偏移距离大于或等于零。 多个键结构中的至少两个或多个键结构的偏移距离可以不同。 偏移距离的差异可以基于各个键结构相对于第一参考线的位置。
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3.发明申请公开(公告)号：US20080283378A1
公开(公告)日：2008-11-20
申请号：US12128455
申请日：2008-05-28
IPC分类号： H01H13/70
CPC分类号： G06F1/1662 , G06F1/1626 , G06F3/0202 , G06F3/0219 , H01H13/84 , H01H2217/004 , H04M1/23 , H04M1/72547 , H04M2250/70
摘要： A small form-factor keyboard or keypad for key structures is provided in which individual key structures have a contact surface on which there is a center reference and a peak. The center reference and the peak or offset, so that an offset distance between the center reference and the peak is greater than or equal to zero. The offset distance for at least two or more key structures in the plurality of key structures may different. The difference in the offset distance may be based on a position of the individual key structures relative to a first reference line.
摘要翻译： 提供了一种用于键结构的小尺寸键盘或键盘，其中单个键结构具有接触表面，在该接触表面上存在中心参考和峰值。 中心参考和峰值或偏移，使得中心参考和峰值之间的偏移距离大于或等于零。 多个键结构中的至少两个或多个键结构的偏移距离可以不同。 偏移距离的差异可以基于各个键结构相对于第一参考线的位置。
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