公开(公告)号：US08549379B2

公开(公告)日：2013-10-01

申请号：US12950171

申请日：2010-11-19

申请人： Alfred L. Rodriguez ,  Nicholas J. Possley ,  Kevin Boshears ,  Austin H. Lesea ,  Jameel Hussein

发明人： Alfred L. Rodriguez ,  Nicholas J. Possley ,  Kevin Boshears ,  Austin H. Lesea ,  Jameel Hussein

IPC分类号： G06F11/00

CPC分类号： G06F11/106

摘要： Methods and systems mitigate a soft error in an integrated circuit. A map is stored in a memory, and the map specifies a criticality class for each storage bit in the integrated circuit. A mitigative technique is associated with each criticality class. The soft error is detected in a corrupted one of the storage bits. The mitigative technique is performed that is associated with the criticality class specified in the map for the corrupted storage bit.

摘要翻译： 方法和系统减轻了集成电路中的软错误。 映射存储在存储器中，映射指定集成电路中每个存储位的关键等级。 缓解技术与每个临界级相关联。 在损坏的一个存储位中检测到软错误。 执行缓解技术，其与映射中为损坏的存储位指定的关键等级相关联。

公开(公告)号：US20120131417A1

公开(公告)日：2012-05-24

申请号：US12950171

申请日：2010-11-19

申请人： Alfred L. Rodriguez ,  Nicholas J. Possley ,  Kevin Boshears ,  Austin H. Lesea

发明人： Alfred L. Rodriguez ,  Nicholas J. Possley ,  Kevin Boshears ,  Austin H. Lesea

IPC分类号： H03M13/05 ,  G06F11/10

CPC分类号： G06F11/106

摘要： Methods and systems mitigate a soft error in an integrated circuit. A map is stored in a memory, and the map specifies a criticality class for each storage bit in the integrated circuit. A mitigative technique is associated with each criticality class. The soft error is detected in a corrupted one of the storage bits. The mitigative technique is performed that is associated with the criticality class specified in the map for the corrupted storage bit.

摘要翻译： 方法和系统减轻了集成电路中的软错误。 映射存储在存储器中，映射指定集成电路中每个存储位的关键等级。 缓解技术与每个临界级相关联。 在损坏的一个存储位中检测到软错误。 执行缓解技术，其与映射中为损坏的存储位指定的关键等级相关联。