公开(公告)号：US07533574B2

公开(公告)日：2009-05-19

申请号：US10579056

申请日：2004-11-15

Applicant: David R. McMurtry ,  Geoff McFarland ,  Kevyn B. Jonas

Inventor： David R. McMurtry ,  Geoff McFarland ,  Kevyn B. Jonas

IPC: G01B7/16

CPC classification number: G01B5/0016 ,  G01B21/045

Abstract: A method of error compensation for measurements taken using a co-ordinate positioning apparatus comprising an articulating probe head having a surface detecting device. The surface detecting device is rotated about at least one axis of the articulating probe head during measurement. The method comprises the steps of: determining the stiffness of the whole or part of the apparatus; determining one or more factors which relate to the load applied by the articulating probe head at any particular instant, and determining the measurement error at the surface sensing device caused by the load.

Abstract translation: 使用包括具有表面检测装置的关节式探针头的坐标定位装置进行的测量的误差补偿方法。 在测量期间，表面检测装置围绕关节式探头的至少一个轴线旋转。 该方法包括以下步骤：确定装置的整体或部分的刚度; 确定与任何特定时刻由关节式探针头施加的负荷相关的一个或多个因素，以及确定由负载引起的表面感测装置处的测量误差。

公开(公告)号：US07543393B2

公开(公告)日：2009-06-09

申请号：US11987103

申请日：2007-11-27

Applicant: David R. McMurtry ,  Geoffrey McFarland ,  Kevyn B. Jonas ,  Leo C. Somerville

Inventor： David R. McMurtry ,  Geoffrey McFarland ,  Kevyn B. Jonas ,  Leo C. Somerville

IPC: G01B5/004

CPC classification number: G01B21/042 ,  G01B21/045

Abstract: A method of measuring an object using a surface sensing device mounted on a coordinate positioning apparatus. The method has the steps of measuring a single surface point of a feature of the object with the surface sensing device, moving the surface sensing device along a path around the feature at a fast speed, thereby taking measurements along the path, including at the surface point, determining the difference between the measurements of the surface point and using the difference determined to apply a correction to the object or subsequent objects having the same feature.

Abstract translation: 使用安装在坐标定位装置上的表面感测装置测量物体的方法。 该方法具有以下步骤：利用表面感测装置测量物体的特征的单个表面点，使得表面感测装置沿着快速的特征周围的路径移动，从而沿着路径进行测量，包括在表面 确定表面点的测量之间的差异，并使用确定的差异来对具有相同特征的对象或后续对象应用校正。

公开(公告)号：US06633051B1

公开(公告)日：2003-10-14

申请号：US09701699

申请日：2000-12-01

Applicant: Alan J Holloway ,  Kevyn B Jonas ,  David A Wright

Inventor： Alan J Holloway ,  Kevyn B Jonas ,  David A Wright

IPC: G01N2186

CPC classification number: G01B11/007

Abstract: A surface sensing device includes an articulating head adapted for attachment to the spindle of a measuring machine and having two relatively rotatable parts capable of rotation about two mutually perpendicular axes. The device additionally includes a stylus assembly having a relatively stiff hollow stylus carrier, and a relatively flexible hollow stylus. An optical transducer system is provided within the stylus assembly and comprises a fixed light source which directs a beam of light towards a stylus tip, and a retro-reflective component at the tip which reflects the beam back to a fixed detector. The arrangement is such that lateral displacement of the stylus tip when the tip is in contact with a surface can be measured directly.

Abstract translation: 表面感测装置包括铰接头，该铰接头适于附接到测量机的心轴上并且具有两个相对可旋转的部件，能够围绕两个相互垂直的轴线旋转。 该装置还包括具有相对刚性的空心触针托架的触针组件和相对柔性的中空触针。 光学传感器系统设置在触针组件内，并且包括将光束引向触针尖端的固定光源以及将光束反射回固定探测器的尖端处的反射反射部件。 这种布置使得当尖端与表面接触时触针尖端的横向位移可以直接测量。

公开(公告)号：US07286949B2

公开(公告)日：2007-10-23

申请号：US11501872

申请日：2006-08-10

Applicant: Geoffrey McFarland ,  Kevyn B. Jonas ,  James F. Robertson ,  Nicholas J. Weston ,  Kenneth C. H. Nai

Inventor： Geoffrey McFarland ,  Kevyn B. Jonas ,  James F. Robertson ,  Nicholas J. Weston ,  Kenneth C. H. Nai

IPC: G01C17/38 ,  G01P21/00

CPC classification number: G01B21/045

Abstract: Error correction of measurements of workpieces taken using a coordinate positioning apparatus in which the workpiece is mounted on a bed of the apparatus and a workpiece sensing probe is moved relative to the bed into a position sensing relationship with each workpiece and a position reading taken, and in which means are provided for measuring at least a function of the acceleration of the probe relative to the bed, the method including, in any suitable order: measuring the workpiece; determining the repeatable measurement errors from a predetermined error function, look-up table or map; measuring at least a function of the acceleration and calculating the unrepeatable measurement errors as the workpiece is measured; and combining the repeatable and non repeatable errors in steps (b) and (c) to determine the total errors; and using the total errors determined in step (d) to correct the measurements of the workpiece.

Abstract translation: 使用坐标定位装置测量的工件的误差校正，其中将工件安装在装置的床上，并且工件感测探针相对于床移动到与每个工件的位置感测关系和取得的位置读数，以及 其中提供了用于至少测量所述探头相对于所述床的加速度的功能的装置，所述方法包括以任何合适的顺序：测量所述工件; 从预定的误差函数，查找表或地图确定可重复的测量误差; 至少测量加速度的函数，并在测量工件时计算不可重复的测量误差; 并且在步骤（b）和（c）中组合可重复和不可重复的错误以确定总错误; 并使用在步骤（d）中确定的总误差来校正工件的测量值。

公开(公告)号：US20110273702A1

公开(公告)日：2011-11-10

申请号：US13145194

申请日：2010-01-20

Applicant: Nicholas H. H. Jones ,  Nicholas J. Weston ,  Kevyn B. Jonas ,  Jonathan D. Shephard ,  Duncan P. Hand ,  Mateusz Matysiak

Inventor： Nicholas H. H. Jones ,  Nicholas J. Weston ,  Kevyn B. Jonas ,  Jonathan D. Shephard ,  Duncan P. Hand ,  Mateusz Matysiak

IPC: G01J3/30 ,  G01N21/88 ,  G01N21/27

CPC classification number: G01N21/8806 ,  G01N21/8422 ,  G01N21/95 ,  G01N21/9515

Abstract: A detecting system for detecting flaws in a sample includes an illumination assembly and detecting assembly. The illumination assembly has an infra-red light source and illumination optics for directing a beam of light from the light source to a spot on or within a sample. The detection assembly has a detector for detecting light from an illuminated spot on or within a sample and detection optics for directing light from an illuminated spot on or within a sample to the detector. Such a system may be used for determining flaws in a sample such as a thermal barrier coating on a turbine blade, or a dental or other medical part. In particular the system may be used for determining flaws in a ceramic sample. A method for detecting flaws in a sample is further described.

Abstract translation: 用于检测样本中的缺陷的检测系统包括照明组件和检测组件。 照明组件具有红外光源和照明光学器件，用于将来自光源的光束引导到样品上或样品内的斑点。 检测组件具有检测器，用于检测来自样本上或样品内的照明点的光，以及检测光学器件，用于将来自样品上的照射斑点的光引导到检测器。 这样的系统可用于确定样品中的缺陷，例如涡轮叶片或牙科或其它医疗部件上的热障涂层。 特别地，该系统可用于确定陶瓷样品中的缺陷。 进一步描述用于检测样品中的缺陷的方法。