Test apparatus with low-reflection signal distribution
    1.
    发明申请
    Test apparatus with low-reflection signal distribution 有权
    具有低反射信号分布的测试装置

    公开(公告)号:US20060186896A1

    公开(公告)日:2006-08-24

    申请号:US11348525

    申请日:2006-02-07

    IPC分类号: G01R27/04

    CPC分类号: G01R31/2841

    摘要: A test apparatus includes a signal source that generates a radio-frequency test signal and is connected to the input connection of an arrangement. The arrangement simultaneously supplies an electrical radio-frequency signal to a plurality of receivers and via a plurality of distribution lines. Each distribution line includes an end with an output connection that applies the power-matched test signal to a respective external component.

    摘要翻译: 测试装置包括产生射频测试信号并连接到装置的输入连接的信号源。 该装置同时向多个接收器和多个分配线提供电射频信号。 每个分配线包括具有将功率匹配测试信号施加到相应外部组件的输出连接的端点。

    Test apparatus with low-reflection signal distribution
    2.
    发明授权
    Test apparatus with low-reflection signal distribution 有权
    具有低反射信号分布的测试装置

    公开(公告)号:US07355414B2

    公开(公告)日:2008-04-08

    申请号:US11348525

    申请日:2006-02-07

    IPC分类号: G01R27/04

    CPC分类号: G01R31/2841

    摘要: A test apparatus includes a signal source that generates a radio-frequency test signal and is connected to the input connection of an arrangement. The arrangement simultaneously supplies an electrical radio-frequency signal to a plurality of receivers and via a plurality of distribution lines. Each distribution line includes an end with an output connection that applies the power-matched test signal to a respective external component.

    摘要翻译: 测试装置包括产生射频测试信号并连接到装置的输入连接的信号源。 该装置同时向多个接收器和多个分配线提供电射频信号。 每个分配线包括具有将功率匹配测试信号施加到相应外部组件的输出连接的端点。