CHAMBER APPARATUS AND EXTREME ULTRAVIOLET LIGHT GENERATION SYSTEM
    2.
    发明申请
    CHAMBER APPARATUS AND EXTREME ULTRAVIOLET LIGHT GENERATION SYSTEM 有权
    室外设备和极光紫外线发光系统

    公开(公告)号:US20130126761A1

    公开(公告)日:2013-05-23

    申请号:US13562950

    申请日:2012-07-31

    IPC分类号: G21K5/00

    摘要: A chamber apparatus, which may be used with an external apparatus having an obscuration region, may include: a chamber in which EUV light is generated; a collector mirror having a first through-hole formed in a region aside from the center thereof and configured to collect the EUV light generated inside the chamber, the collector mirror being positioned such that the first through-hole is located in a region substantially corresponding to the obscuration region; and an etching gas supply unit provided in the first through-hole and configured to supply an etching gas into the chamber.

    摘要翻译: 可以与具有遮蔽区域的外部设备一起使用的室设备可以包括:产生EUV光的室; 收集器反射镜,其具有形成在其中心的区域中的第一通孔,并且被构造成收集室内产生的EUV光,收集器反射镜被定位成使得第一通孔位于基本对应于 遮蔽区; 以及蚀刻气体供给单元,设置在所述第一通孔中,并且被配置为向所述室供给蚀刻气体。

    Chamber apparatus and extreme ultraviolet light generation system
    3.
    发明授权
    Chamber apparatus and extreme ultraviolet light generation system 有权
    室内设备和极紫外光发生系统

    公开(公告)号:US08884257B2

    公开(公告)日:2014-11-11

    申请号:US13562950

    申请日:2012-07-31

    IPC分类号: G02B5/08 G21K5/00 H05G2/00

    摘要: A chamber apparatus, which may be used with an external apparatus having an obscuration region, may include: a chamber in which EUV light is generated; a collector mirror having a first through-hole formed in a region aside from the center thereof and configured to collect the EUV light generated inside the chamber, the collector mirror being positioned such that the first through-hole is located in a region substantially corresponding to the obscuration region; and an etching gas supply unit provided in the first through-hole and configured to supply an etching gas into the chamber.

    摘要翻译: 可以与具有遮蔽区域的外部设备一起使用的室设备可以包括:产生EUV光的室; 收集器反射镜,其具有形成在其中心的区域中的第一通孔,并且被构造成收集室内产生的EUV光,收集器反射镜被定位成使得第一通孔位于基本对应于 遮蔽区; 以及蚀刻气体供给单元,设置在所述第一通孔中,并且被配置为向所述室供给蚀刻气体。