公开(公告)号：US20090314607A1

公开(公告)日：2009-12-24

申请号：US12309678

申请日：2006-07-27

申请人： Koya Karino ,  Akihiko Ito

发明人： Koya Karino ,  Akihiko Ito

IPC分类号： B65G43/00 ,  G01R19/00

CPC分类号： G01R31/2893 ,  G01R1/04

摘要： In a handler comprising a movable head (suction pads) capable of holding and conveying a plurality of pre-test IC devices at a time: when conveying a plurality of pre-test IC devices from a supply customer tray KST to a test tray TST, a first step of leaving on the customer tray KST pre-test IC devices loaded on positions corresponding to turned-off sockets, holding by the suction pads only pre-test IC devices on the customer tray KST loaded on positions corresponding to other sockets than the turned-off ones and conveying them from the customer tray KST to the test tray TST without changing the arrangement; and a second step of conveying pre-test IC devices left on the customer tray KST for the reason of being at positions corresponding to the turned-off sockets from the customer tray KST to positions on the test tray TST corresponding to other sockets than the turned-off sockets are performed.

摘要翻译： 在包括能够一次保持和传送多个预测IC器件的可移动头（吸盘）的处理器中：当将多个预测IC器件从供应顾客托盘KST传送到测试托盘TST时， 离开客户托盘的第一步KST预先测试加载在与关闭插座相对应的位置上的IC设备，由吸盘保持仅对在与其他插座相对应的位置上的客户托盘KST上的IC器件进行预测试 将其从客户托盘KST传送到测试托盘TST而不改变安排; 并且第二步是将客户托盘KST上剩下的预测IC器件输送到与从客户托盘KST截止的插座相对应的位置到对应于其它插座的测试托架TST上的位置 执行插座。

公开(公告)号：US20100147088A1

公开(公告)日：2010-06-17

申请号：US12161067

申请日：2006-01-17

申请人： Akihiko Ito ,  Koya Karino ,  Yoshihito Kobayashi

发明人： Akihiko Ito ,  Koya Karino ,  Yoshihito Kobayashi

IPC分类号： G01N1/00 ,  G01R31/02

CPC分类号： G01R31/2893

摘要： An electronic device test apparatus used for bringing the ICs into electrical contact with contact parts of the test head in the state where the ICs are held on a test tray and running tests on the electrical characteristics of ICs, the electronic device test apparatus including an inversion system for rotating the test tray which holds a plurality of ICs in a direction dropping ICs which are insufficiently held at least once before testing.

摘要翻译： 一种电子设备测试装置，用于在IC保持在测试托盘上的状态下使IC与测试头的接触部分电接触，并对IC的电气特性进行运行测试，电子设备测试设备包括反演 系统，用于使测试托盘旋转，所述测试托盘在测试之前沿着不足够保持至少一次的IC的方向保持多个IC。