公开(公告)号：US07755365B2

公开(公告)日：2010-07-13

申请号：US12149416

申请日：2008-05-01

Applicant: Kun-Shan Cheng ,  Che-Wei Huang

Inventor： Kun-Shan Cheng ,  Che-Wei Huang

IPC: G01R31/02

CPC classification number: G01R31/2886 ,  G01R1/0433

Abstract: An electronic element testing and supporting apparatus includes a circuit board, an outer frame, an inner frame, a plate and two locking devices. The outer frame is assembled on a second surface of the circuit board and has a plurality of outer frame. Two opposing outer frame rims are provided respectively with a slot having an accommodating opening and an accommodating hole. The inner frame is lodged in the outer frame. The plate is inserted into the slots via the accommodating openings of the two opposing outer frame rims. The locking device includes an elastic element disposed in the accommodating hole of the outer frame rim and a stopper. The elastic element abuts against the stopper, so that the stopper can be movably extended into the corresponding slot to stop the plate. Via this arrangement, the present invention avoids using screws to lock the plate and the inner frame.

Abstract translation: 电子元件测试和支持设备包括电路板，外框架，内框架，板和两个锁定装置。 外框组装在电路板的第二表面上并具有多个外框。 两个相对的外框架边缘分别设置有具有容纳孔和容纳孔的槽。 内框架放置在外框架中。 板通过两个相对的外框架边缘的容纳开口插入槽中。 锁定装置包括设置在外框架边缘的容纳孔中的弹性元件和止动件。 弹性元件抵靠止动件，使得止动件可以可移动地延伸到相应的槽中以阻止板。 通过这种布置，本发明避免使用螺钉来锁定板和内框架。

公开(公告)号：US20090273351A1

公开(公告)日：2009-11-05

申请号：US12149416

申请日：2008-05-01

Applicant: Kun-Shan Cheng ,  Che-Wei Huang

Inventor： Kun-Shan Cheng ,  Che-Wei Huang

IPC: G01R31/02

CPC classification number: G01R31/2886 ,  G01R1/0433

Abstract: An electronic element testing and supporting apparatus includes a circuit board, an outer frame, an inner frame, a plate and two locking devices. The outer frame is assembled on a second surface of the circuit board and has a plurality of outer frame. Two opposing outer frame rims are provided respectively with a slot having an accommodating opening and an accommodating hole. The inner frame is lodged in the outer frame. The plate is inserted into the slots via the accommodating openings of the two opposing outer frame rims. The locking device includes an elastic element disposed in the accommodating hole of the outer frame rim and a stopper. The elastic element abuts against the stopper, so that the stopper can be movably extended into the corresponding slot to stop the plate. Via this arrangement, the present invention avoids using screws to lock the plate and the inner frame.

Abstract translation: 电子元件测试和支持设备包括电路板，外框架，内框架，板和两个锁定装置。 外框组装在电路板的第二表面上并具有多个外框。 两个相对的外框架边缘分别设置有具有容纳孔和容纳孔的槽。 内框架放置在外框架中。 板通过两个相对的外框架边缘的容纳开口插入槽中。 锁定装置包括设置在外框架边缘的容纳孔中的弹性元件和止动件。 弹性元件抵靠止动件，使得止动件可以可移动地延伸到相应的槽中以阻止板。 通过这种布置，本发明避免使用螺钉来锁定板和内框架。