公开(公告)号：US07180312B2

公开(公告)日：2007-02-20

申请号：US10395208

申请日：2003-03-25

申请人： Yoshikazu Arisaka ,  Kunihiro Itagaki ,  Shigenobu Ishihara ,  Tomohiro Giga ,  Naoyoshi Kikuchi

发明人： Yoshikazu Arisaka ,  Kunihiro Itagaki ,  Shigenobu Ishihara ,  Tomohiro Giga ,  Naoyoshi Kikuchi

IPC分类号： G01R31/02

CPC分类号： G01R3/00 ,  G01R1/07342 ,  H01L2924/0002 ,  H01L2924/00

摘要： A probe card that is manufactured inexpensively. The probe card includes a base plate, a flexible substrate, and a contact probe. The contact probe is a flexible substrate formed from polyimide resin. The contact probe has a plurality of parallel wires. Each wire has a distal end that functions as a contact. The contact probe is produced by cutting a general purpose substrate having a plurality of parallel wires formed at a predetermined pitch. The number of the parallel wires is equal to the number of pads of an LSI chip.

公开(公告)号：US20070134824A1

公开(公告)日：2007-06-14

申请号：US11698036

申请日：2007-01-26

申请人： Yoshikazu Arisaka ,  Kunihiro Itagaki ,  Shigenobu Ishihara ,  Tomohiro Giga ,  Naoyoshi Kikuchi

发明人： Yoshikazu Arisaka ,  Kunihiro Itagaki ,  Shigenobu Ishihara ,  Tomohiro Giga ,  Naoyoshi Kikuchi

IPC分类号： H01L21/66

CPC分类号： G01R3/00 ,  G01R1/07342 ,  H01L2924/0002 ,  H01L2924/00

摘要： A probe card that is manufactured inexpensively. The probe card includes a base plate, a flexible substrate, and a contact probe. The contact probe is a flexible substrate formed from polyimide resin. The contact probe has a plurality of parallel wires. Each wire has a distal end that functions as a contact. The contact probe is produced by cutting a general purpose substrate having a plurality of parallel wires formed at a predetermined pitch. The number of the parallel wires is equal to the number of pads of an LSI chip.

摘要翻译： 低成本制造的探针卡。 探针卡包括基板，柔性基板和接触探针。 接触探针是由聚酰亚胺树脂形成的柔性基底。 接触探针具有多条平行的线。 每根线都有一个远端作为一个触点。 接触探针通过切割具有以预定间距形成的多条平行线的通用基板来制造。 并联线的数量等于LSI芯片的焊盘数量。

公开(公告)号：US07256591B2

公开(公告)日：2007-08-14

申请号：US10284085

申请日：2002-10-31

申请人： Tsutomu Tatematsu ,  Kenji Togashi ,  Tetsuhiro Nanbu ,  Shigenobu Ishihara ,  Morihiko Hamada ,  Yoshikazu Arisaka ,  Kunihiro Itagaki ,  Shigekazu Aoki

发明人： Tsutomu Tatematsu ,  Kenji Togashi ,  Tetsuhiro Nanbu ,  Shigenobu Ishihara ,  Morihiko Hamada ,  Yoshikazu Arisaka ,  Kunihiro Itagaki ,  Shigekazu Aoki

IPC分类号： G01R31/02

CPC分类号： G01R1/07314

摘要： A probe card is used to test an electronic device. The probe card includes a base plate and a cantilever-type probe arranged on the base plate. The cantilever-type probe has an end that contacts the contacted body and moves when contacting the contacted body. A stopper arranged on the base plate restricts the movement of the cantilever-type probe.

摘要翻译： 探针卡用于测试电子设备。 探针卡包括基板和布置在基板上的悬臂式探头。 悬臂式探头具有接触被接触体的一端，并且在与接触体接触时移动。 布置在基板上的止动件限制悬臂式探头的移动。