公开(公告)号：US07171592B2

公开(公告)日：2007-01-30

申请号：US10360862

申请日：2003-02-10

申请人： Kenji Togashi ,  Morihiko Hamada ,  Shigekazu Aoki ,  Katsumi Shigenobu ,  Yukio Saka ,  Yoshikazu Arisaka ,  Toyoji Sawada ,  Tadashi Asai

发明人： Kenji Togashi ,  Morihiko Hamada ,  Shigekazu Aoki ,  Katsumi Shigenobu ,  Yukio Saka ,  Yoshikazu Arisaka ,  Toyoji Sawada ,  Tadashi Asai

IPC分类号： G06F11/00

CPC分类号： G11C29/4401 ,  G11C29/789 ,  G11C29/848

摘要： A semiconductor memory device includes a self-testing circuit and a self-redundancy circuit with simple structures. The self-testing circuit includes a comparison circuit which compares write data with read data with respect to normal memory blocks and redundant memory blocks, and a decision circuit which decides if the semiconductor memory device is good or defective based on the plurality of comparison result signals. A signal transfer and holding circuit is connected between the comparison circuit and the decision circuit to transfer the plurality of comparison result signals to the decision circuit and to supply the plurality of comparison result signals to the self-redundancy circuit as a test result.

摘要翻译： 半导体存储器件包括具有简单结构的自检电路和自冗余电路。 自检电路包括比较电路，其将写入数据与读取数据相对于正常存储器块和冗余存储器块进行比较，以及判定电路，其基于多个比较结果信号来判定半导体存储器件是否良好或有缺陷 。 信号传送和保持电路连接在比较电路和判定电路之间，以将多个比较结果信号传送到判定电路，并将多个比较结果信号提供给自冗余电路作为测试结果。

公开(公告)号：US5943280A

公开(公告)日：1999-08-24

申请号：US10827

申请日：1998-01-22

申请人： Yukihiro Tsukamoto ,  Koji Kimura ,  Masaki Nishimoto ,  Masayuki Kasamoto ,  Naotaka Okada ,  Kazuhisa Uetsuki ,  Masakatsu Murakami ,  Shigekazu Aoki ,  Zengcheng Tian ,  Shin Sekiya ,  Akihiro Shirai

发明人： Yukihiro Tsukamoto ,  Koji Kimura ,  Masaki Nishimoto ,  Masayuki Kasamoto ,  Naotaka Okada ,  Kazuhisa Uetsuki ,  Masakatsu Murakami ,  Shigekazu Aoki ,  Zengcheng Tian ,  Shin Sekiya ,  Akihiro Shirai

IPC分类号： G11C11/406 ,  G11C11/401 ,  G11C11/403 ,  G11C29/12 ,  G11C29/50 ,  G11C7/00

CPC分类号： G11C29/50 ,  G11C11/401

摘要： When a special operation mode is instructed, a test oscillation circuit operating at a cycle shorter than a refresh oscillation circuit specifying the cycle of self refresh is activated according to an external row address strobe signal. The internal row address strobe signal is provided to row related control circuitry via a selector. An internal row address strobe signal can be rendered active at a cycle shorter than the cycle of the external row address strobe signal, to carry out row selection. A row is selected at a cycle shorter than the transition cycle of an external signal.

摘要翻译： 当指示特殊操作模式时，根据外部行地址选通信号激活以比指定自刷新周期的刷新振荡电路短的周期工作的测试振荡电路。 内部行地址选通信号通过选择器提供给行相关的控制电路。 可以以比外部行地址选通信号的周期短的周期使内部行地址选通信号激活，以执行行选择。 以比外部信号的转换周期短的周期来选择一行。

公开(公告)号：US06335887B1

公开(公告)日：2002-01-01

申请号：US09727544

申请日：2000-12-04

申请人： Shigekazu Aoki ,  Seiji Sawada ,  Mikio Asakura ,  Takeshi Hamamoto ,  Masakazu Hirose

发明人： Shigekazu Aoki ,  Seiji Sawada ,  Mikio Asakura ,  Takeshi Hamamoto ,  Masakazu Hirose

IPC分类号： G11C700

CPC分类号： G11C29/34

摘要： The semiconductor memory device has a word configuration determination signal generating circuit including a plurality of generating circuits, each of which is formed of two clocked inverters and two inverters. In a normal operation mode, a test mode signal TX4 is inactivated and a word configuration determination signal [x16E] of an H level is output. In a test mode, the test mode signal TX4 is activated and a word configuration determination signal [x4E] of an H level is output. Thus, in the test mode, the word configuration is switched to the one that is smaller than in the normal operation mode. This allows simultaneous testing of a larger number of semiconductor memory devices.

公开(公告)号：US07256591B2

公开(公告)日：2007-08-14

申请号：US10284085

申请日：2002-10-31

申请人： Tsutomu Tatematsu ,  Kenji Togashi ,  Tetsuhiro Nanbu ,  Shigenobu Ishihara ,  Morihiko Hamada ,  Yoshikazu Arisaka ,  Kunihiro Itagaki ,  Shigekazu Aoki

发明人： Tsutomu Tatematsu ,  Kenji Togashi ,  Tetsuhiro Nanbu ,  Shigenobu Ishihara ,  Morihiko Hamada ,  Yoshikazu Arisaka ,  Kunihiro Itagaki ,  Shigekazu Aoki

IPC分类号： G01R31/02

CPC分类号： G01R1/07314

摘要： A probe card is used to test an electronic device. The probe card includes a base plate and a cantilever-type probe arranged on the base plate. The cantilever-type probe has an end that contacts the contacted body and moves when contacting the contacted body. A stopper arranged on the base plate restricts the movement of the cantilever-type probe.

摘要翻译： 探针卡用于测试电子设备。 探针卡包括基板和布置在基板上的悬臂式探头。 悬臂式探头具有接触被接触体的一端，并且在与接触体接触时移动。 布置在基板上的止动件限制悬臂式探头的移动。

公开(公告)号：US06750744B2

公开(公告)日：2004-06-15

申请号：US10228270

申请日：2002-08-27

申请人： Syuichi Misumi ,  Yuichi Kariya ,  Hiroyuki Miyano ,  Shigekazu Aoki ,  Kenji Nakamura ,  Tatsuro Ishikawa ,  Takehiko Nakagawa

发明人： Syuichi Misumi ,  Yuichi Kariya ,  Hiroyuki Miyano ,  Shigekazu Aoki ,  Kenji Nakamura ,  Tatsuro Ishikawa ,  Takehiko Nakagawa

IPC分类号： H01H5122

CPC分类号： H01H51/2236 ,  H01H11/0056 ,  H01H50/023 ,  H01H50/36 ,  H01H2001/5888 ,  H01H2011/0087 ,  H01H2229/02

摘要： An electromagnetic relay is provided with an iron core (50) which has a virtually J-letter shape on a plan view with one end serving as a support-receiving portion (51) and the other end serving as a magnetic pole portion (52), and a movable iron member (60) which is supported by a movable contact member (70) attached to a corner thereof, and has a virtually L-letter shape on a plan view with one end (61) being supported on the support-receiving portion (51) of the iron core (50) so as to freely pivot thereon and an adsorb portion (62) that is the other end being allowed to face the magnetic pole portion (52) of the iron core (50) so as to be adsorbed thereon. The objective of the present invention is to provide an inexpensive electromagnetic relay which is less susceptible to deviations in the adsorb portion of the movable iron member that comes into contact with and separates from the magnetic pole portion of the iron core, and has stable operation characteristics.

摘要翻译： 一种电磁继电器具有铁芯（50），该铁芯（50）在平面图上具有实际上为J字形形状，一端用作支撑接收部分（51），另一端用作磁极部分（52） 以及可动铁构件（60），其由附接到其角部的可动接触构件（70）支撑，并且在平面图上具有实际上L字形的形状，一端（61）被支撑在支撑 - 铁芯（50）的接收部分（51）以便自由枢转，并且允许另一端的吸附部分（62）面对铁芯（50）的磁极部分（52），以便 被吸附在其上。 本发明的目的是提供一种便宜的电磁继电器，其不易受与铁芯的磁极部分接触和分离的可动铁构件的吸附部分的偏差的影响，并且具有稳定的操作特性 。

公开(公告)号：US20050158005A1

公开(公告)日：2005-07-21

申请号：US11035794

申请日：2005-01-14

申请人： Hiroyuki Otsuka ,  Shigekazu Aoki ,  Masayoshi Tani

发明人： Hiroyuki Otsuka ,  Shigekazu Aoki ,  Masayoshi Tani

IPC分类号： G02B6/24 ,  B29C45/14 ,  B29C45/26 ,  B29K101/10 ,  B29L11/00 ,  G02B6/00 ,  G02B6/36 ,  G02B6/38 ,  G02B6/40

CPC分类号： G02B6/3865 ,  G02B6/3636 ,  G02B6/3652 ,  G02B6/3696 ,  G02B6/3885

摘要： An optical fiber holding member in which occurrence of defectives is prevented by increasing the degree of accuracy in pitches of the optical fibers with a simplified manufacturing method, and a method of manufacturing the same are provided. A deflection generating block is disposed in a cavity for molding a holder, and a positioning block is disposed in contact with the cavity. The deflection generating block is formed with V-shaped holding grooves for the optical fibers. The positioning block has grooves for placing the optical fibers. The holding grooves and the grooves are shifted laterally of the extending direction of the optical fibers. The optical fibers and the positioning surfaces of the grooves are in press-contact by a resilient restoring force of the optical fibers, and are positioned in the lateral or vertical direction. In this state, resin is injected into the cavity, whereby obtaining the optical fiber holding member.

摘要翻译： 通过以简化的制造方法提高光纤的间距的精度来防止出现缺陷的光纤保持构件及其制造方法。 挠曲发生块设置在用于模制保持器的空腔中，并且定位块设置成与腔体接触。 挠曲发生块形成有用于光纤的V形保持槽。 定位块具有用于放置光纤的凹槽。 保持槽和槽沿光纤的延伸方向横向偏移。 光纤和凹槽的定位表面通过光纤的弹性恢复力进行压接，并且位于横向或垂直方向上。 在这种状态下，将树脂注入空腔中，从而获得光纤保持构件。