公开(公告)号：US20050022086A1

公开(公告)日：2005-01-27

申请号：US10823498

申请日：2004-04-13

申请人： Anton Kotz ,  Uwe Bruckdorfer ,  Matthias Haschka ,  Kurt Feldmeyer ,  Peter Klein

发明人： Anton Kotz ,  Uwe Bruckdorfer ,  Matthias Haschka ,  Kurt Feldmeyer ,  Peter Klein

IPC分类号： G01R31/28 ,  G01R31/3167 ,  G01R31/317 ,  G06F11/00

CPC分类号： G01R31/31724 ,  G01R31/2834 ,  G01R31/3167

摘要： The invention refers to a method which generates an IC tester control consisting of numerous test instructions for a plurality of specific test environments, which can generate and measure analog and digital signals for an IC, in particular a mixed-signal IC. The method obtains data and control instructions from multidimensional test matrices independent of the test environment, such as matrix-like databases or libraries. The data and control instructions independent of the test environment are converted by means of a code generator into a syntax which is dependent on the test environment and which can be integrated into a general syntax dependent on the test environment, so that the syntax dependent on the test environment and the general syntax dependent on the test environment together form a complete control, comprising analog and digital signals, for one of the specific test environments.

摘要翻译： 本发明涉及一种生成IC测试器控制的方法，该控制器包括用于多个特定测试环境的许多测试指令，其可以产生和测量用于IC，特别是混合信号IC的模拟和数字信号。 该方法从独立于测试环境的多维测试矩阵获取数据和控制指令，如矩阵式数据库或库。 独立于测试环境的数据和控制指令通过代码生成器转换为依赖于测试环境的语法，并且可以将其集成到依赖于测试环境的通用语法中，从而使语法依赖于 测试环境和依赖于测试环境的一般语法一起形成了对于特定测试环境之一的完整控制，包括模拟和数字信号。