System and method for generating and measuring noise parameters
    1.
    发明申请
    System and method for generating and measuring noise parameters 有权
    用于生成和测量噪声参数的系统和方法

    公开(公告)号:US20050267716A1

    公开(公告)日:2005-12-01

    申请号:US10853467

    申请日:2004-05-25

    IPC分类号: G06F15/00 H04B17/00

    CPC分类号: H04B17/345

    摘要: A method for measuring noise parameters includes generating a noise signal at a noise source. The noise signal includes a first input signal at a first frequency and a second input signal at a second frequency. The first input signal and the second input signal are modulated onto a carrier to generate a modulated signal. The modulated signal is attenuated to a desired power level and applied to a device under test to obtain a noise measurement.

    摘要翻译: 用于测量噪声参数的方法包括在噪声源处产生噪声信号。 噪声信号包括第一频率的第一输入信号和第二频率的第二输入信号。 第一输入信号和第二输入信号被调制到载波上以产生调制信号。 调制信号被衰减到期望的功率电平并且被施加到被测器件以获得噪声测量。

    System and method for generating and measuring noise parameters
    2.
    发明授权
    System and method for generating and measuring noise parameters 有权
    用于生成和测量噪声参数的系统和方法

    公开(公告)号:US07177772B2

    公开(公告)日:2007-02-13

    申请号:US10853467

    申请日:2004-05-25

    IPC分类号: G01R25/00

    CPC分类号: H04B17/345

    摘要: A method for measuring noise parameters includes generating a noise signal at a noise source. The noise signal includes a first input signal at a first frequency and a second input signal at a second frequency. The first input signal and the second input signal are modulated onto a carrier to generate a modulated signal. The modulated signal is attenuated to a desired power level and applied to a device under test to obtain a noise measurement.

    摘要翻译: 用于测量噪声参数的方法包括在噪声源处产生噪声信号。 噪声信号包括第一频率的第一输入信号和第二频率的第二输入信号。 第一输入信号和第二输入信号被调制到载波上以产生调制信号。 调制信号被衰减到期望的功率电平并且被施加到被测器件以获得噪声测量。